Showing 1 - 20 of 19,532

Effect of interfacial oxygen on the microstructure of MBE-grown homoepitaxial N-polar GaN
STORM, D. F ; McCONKIE, T ; KATZER, D. S ; et al.
Journal of crystal growth. 409:14-17

Yttrium oxide thin films: Influence of the oxygen vacancy network organization on the microstructure
JUBLOT, M ; PAUMIER, F ; PAILLOUX, F ; et al.
Proceedings of Symposium J on Synthesis Processing and Characterization of Nanoscale Functional Oxide Films - EMRS 2006 Conference, Nice, May 29-June 2, 2006Thin solid films. 515(16):6385-6390

White X-ray beam topography and radiography of Si1-xGex crystals bonded to silicon
ARGUNOVA, T. S ; YI, J. M ; JUNG, J. W ; et al.
8th Biennial Conference on High Resolution X-ray Diffraction and imaging (XTOP 2006), Karlsruhe/Baden-Baden, Germany, 19-22 September 2006Physica status solidi. A, Applications and materials science (Print). 204(8):2669-2674

Vacancy production during plastic deformation in copper determined by in situ X-ray diffraction
UNGAR, Tamas ; SCHAFLER, Erhard ; HANAK, Péter ; et al.
International Symposium on Physics of Materials 10, 2005Materials science & engineering. A, Structural materials : properties, microstructure and processing. 462(1-2):398-401

Ti vacancies on the (001) surface of TiS2 detected by scanning tunneling microscopy : A combined experimental and theoretical study
AMZALLAG, Emilie ; MARTINEZ, Hervé ; BARAILLE, Isabelle ; et al.
Solid state sciences. 9(7):594-599

Threading dislocations in heteroepitaxial AlN layer grown by MOVPE on SiC (0001) substrate
TANIYASU, Yoshitaka ; KASU, Makoto ; MAKIMOTO, Toshiki
Thirteenth International Conference on Metal Organic Vapor Phase Epitaxy (ICMOVPE-XIII), Phoenix Seagaia Resort, Miyazaki, 22-26 May 2006Journal of crystal growth. 298:310-315

Thermal evolution of small N-D complexes in deuterated dilute nitrides revealed by in-situ high resolution X-ray diffraction
BISOGNIN, G ; DE SALVADOR, D ; RUBINI, S ; et al.
8th Biennial Conference on High Resolution X-ray Diffraction and imaging (XTOP 2006), Karlsruhe/Baden-Baden, Germany, 19-22 September 2006Physica status solidi. A, Applications and materials science (Print). 204(8):2766-2771

The influence of substrate morphology on the growth of thin silicon films : A GISAXS study
GRACIN, D ; BEMSTORFF, S ; DUBCEK, P ; et al.
Proceedings of the ninth international conference on surface X-Ray and neutron scattering, Taipei, Taiwan, July 16-20, 2006Thin solid films. 515(14):5615-5619

The effect of aspect ratio scaling on hydrostatic stress in passivated interconnects
ANG, D ; WONG, C. C ; RAMANUJAN, R. V
Proceedings of the TMS Symposium - Mechanical Behaviour of Thin Films and Small Structures, San Francisco, California, February 13-17, 2005Thin solid films. 515(6):3246-3252

The effect of InGaN/GaN MQW hydrogen treatment and threading dislocation optimization on GaN LED efficiency
SUIHKONEN, S ; SVENSK, O ; LANG, T ; et al.
Thirteenth International Conference on Metal Organic Vapor Phase Epitaxy (ICMOVPE-XIII), Phoenix Seagaia Resort, Miyazaki, 22-26 May 2006Journal of crystal growth. 298:740-743

TEM analysis of an interface layer formed by the anti-surfactant treatment on a GaN template
KUWANO, N ; HIJIKURO, M ; HATA, S ; et al.
Thirteenth International Conference on Metal Organic Vapor Phase Epitaxy (ICMOVPE-XIII), Phoenix Seagaia Resort, Miyazaki, 22-26 May 2006Journal of crystal growth. 298:284-287

Systematic theoretical investigations of compositional inhomogeneity in InxGa1-xN thin films on GaN(0001)
ITO, Tomonori ; INAHAMA, Shingo ; AKIYAMA, Toru ; et al.
Thirteenth International Conference on Metal Organic Vapor Phase Epitaxy (ICMOVPE-XIII), Phoenix Seagaia Resort, Miyazaki, 22-26 May 2006Journal of crystal growth. 298:186-189

Supersaturated vacancies and vacancy complexes in rapidly solidified B2 aluminide ribbons
NAKAMURA, Ryusuke ; YOSHIMI, Kyosuke ; TSUREKAWA, Sadahiro
Proceedings of the 12th International Conference on Rapidly Quenched & Metastable Materials, Jeju Island, 21-26 August 2005Materials science & engineering. A, Structural materials : properties, microstructure and processing. 449-451:1036-1040

Study of dislocations in CdZnTe single crystals
GANGQIANG ZHA ; WANQI JIE ; TINGTING TAN ; et al.
Physica status solidi. A, Applications and materials science (Print). 204(7):2196-2200

Study of Al thermal diffusion in ZnTe using secondary ion mass spectroscopy
TANAKA, Tooru ; MURATA, Norihiro ; SAITO, Katsuhiko ; et al.
Wide band gap II-VI semiconductors: growth, characterization and applications, Warsaw, 4-8 September 2006Physica status solidi. B. Basic research. 244(5):1685-1690

Structure and surface morphology of Mn-implanted TiO2
IACOMI, F ; APETROAEI, N ; CALIN, G ; et al.
Proceedings of Symposium J on Synthesis Processing and Characterization of Nanoscale Functional Oxide Films - EMRS 2006 Conference, Nice, May 29-June 2, 2006Thin solid films. 515(16):6402-6406

Structural property of β-FeSi2 layers deposited on FeSi from a molten salt
OHISHI, T ; MISHINA, A ; YAMAUCHI, I ; et al.
Asia-Pacific Conference on Semiconducting Silicides Science and Technology Towards Sustainable Optoelectronics (APAC-SILICIDE 2006), July 29-31, 2006, KyotoThin solid films. 515(22):8201-8204

Structural properties of Ge doped CuGaSe2 films studied by Raman and Photoluminescence spectroscopy
THEODOROPOULOU, S ; PAPADIMITRIOU, D ; DOKA, S ; et al.
Proceedings of Symposium O on thin film chalcogenide photovoltaic materials, EMRS 2006 conference, Nice, France, May 29-June 2, 2006Thin solid films. 515(15):5904-5908

Structural investigation of InGaAsN films grown on pseudo-lattice-matched InGaAs substrates by metalorganic vapor phase epitaxy
KONGJAENG, Pornsiri ; SANORPIM, Sakuntam ; YAMAMOTO, Takahisa ; et al.
Thirteenth International Conference on Metal Organic Vapor Phase Epitaxy (ICMOVPE-XIII), Phoenix Seagaia Resort, Miyazaki, 22-26 May 2006Journal of crystal growth. 298:111-115

Structural characterization of thin amorphous Si films
GROZDANIC, D ; RAKVIN, B ; PIVAC, B ; et al.
Proceedings of the ninth international conference on surface X-Ray and neutron scattering, Taipei, Taiwan, July 16-20, 2006Thin solid films. 515(14):5620-5623