Showing 21 - 40 of 33,594

21

A highly dependable self-adaptive mixed-signal multi-core system-on-chip architecture
VON ROSEN, Julius ; SALFELDER, Felix ; HEDRICH, Lars ; et al.
Integration (Amsterdam). 48:55-71

Electronics Electronique Sciences exactes et tech... Exact sciences and techn... Sciences appliquees Applied sciences
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22

100 GHz+ Gain-B andwidth Differential Amplifiers in a Wafer Scale Heterogeneously Integrated Technology Using 250 nm InP DHBTs and 130 nm CMOS
CHINGWEI LI, James ; ELLIOTT, Kenneth R ; MATTHEWS, David S ; et al.
IEEE journal of solid-state circuits. 44(10):2663-2670

Electronics Electronique Sciences exactes et tech... Exact sciences and techn... Sciences appliquees Applied sciences
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23

1-cc Computer : Cross-Layer Integration With UWB-IR Communication and Locationing
NAKAGAWA, Tatsuo ; ONO, Goichi ; KOBAYASHI, Shinsuke ; et al.
The 2007 Symposium on VLSI CircuitsIEEE journal of solid-state circuits. 43(4):964-973

Electronics Electronique Sciences exactes et tech... Exact sciences and techn... Physique Physics
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24

10-Gb/s Optical Fiber Transmission Using a Fully Analog Electronic Dispersion Compensator (EDC) With Unclocked Decision-Feedback Equalization
CHANDRAMOULI, Soumya ; BIEN, Franklin ; KIM, Hyoungsoo ; et al.
2007 International Microwave SymposiumIEEE transactions on microwave theory and techniques. 55(12):2740-2746

Electronics Electronique Optics Optique Telecommunications Télécommunications
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25

Structure bidirectionnelle en courant
BOURENNANE, Abdelhakim ; MURA, Florian ; SANCHEZ, Jean-Louis ; et al.
Conversion de l'énergie et intégration en électronique de puissanceRevue internationale de génie électrique. 10(5):553-565

Electrical engineering Electrotechnique Sciences exactes et tech... Exact sciences and techn... Sciences appliquees Applied sciences
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26

Promotion d'une approche système dans l'intégration monolithique pour semi-conducteurs de puissance
CREBIER, Jean-Christophe ; DAC NGUYEN, Binh ; ROUGER, Loïc Vincent Nicolas ; et al.
Conversion de l'énergie et intégration en électronique de puissanceRevue internationale de génie électrique. 10(5):527-540

Electrical engineering Electrotechnique Sciences exactes et tech... Exact sciences and techn... Sciences appliquees Applied sciences
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27

Young's modulus and residual stress of DF PECVD silicon nitride for MEMS free-standing membranes
CIANCI, E ; COPPA, A ; FOGLIETTI, V
Proceedings of the 32nd International Conference on Micro- and Nano-Engineering, Barcelona, 17-20 September 2006Microelectronic engineering. 84(5-8):1296-1299

Electronics Electronique Sciences exactes et tech... Exact sciences and techn... Sciences appliquees Applied sciences
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28

Yield learning and process optimization on 65-nm CMOS technology accelerated by the use of short flow test die
DEBORD, Jeffrey R. D ; SRIDHAR, Nagarajan
IEEE transactions on semiconductor manufacturing. 20(3):201-207

Electronics Electronique Sciences exactes et tech... Exact sciences and techn... Sciences appliquees Applied sciences
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29

Yield evaluation of 10-kA/cm2 Nb multi-layer fabrication process using conventional superconducting RAMs
NAGASAWA, Shuichi ; SATOH, Tetsuro ; HINODE, Kenji ; et al.
The 2006 applied superconductivity conference, Seattle, WA, August 27-September 1, 2006IEEE transactions on applied superconductivity. 17(2):177-180

Electronics Electronique Electrical engineering Electrotechnique Sciences exactes et tech... Exact sciences and techn...
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30

Wrapper design for the reuse of a bus, network-on-chip, or other functional interconnect as test access mechanism
AMORY, A. M ; GOOSSENS, K ; MARINISSEN, E. J ; et al.
Selected best papers from ETS'06IET computers & digital techniques (Print). 1(3):197-206

Electronics Electronique Computer science Informatique Telecommunications Télécommunications
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31

Wireless clock distribution system using an external antenna
RAN LI ; XIAOLING GUO ; YANG, Dong-Jun ; et al.
IEEE journal of solid-state circuits. 42(10):2283-2292

Electronics Electronique Sciences exactes et tech... Exact sciences and techn... Sciences appliquees Applied sciences
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32

Wideband VCO with simultaneous switching of frequency band, active core, and varactor size
HAUSPIE, Dries ; PARK, Eun-Chul ; CRANINCKX, Jan
ESSCIRC 2006IEEE journal of solid-state circuits. 42(7):1472-1480

Electronics Electronique Sciences exactes et tech... Exact sciences and techn... Sciences appliquees Applied sciences
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33

Waveform analysis and delay prediction for a CMOS gate driving RLC interconnect load
BRAJESH KUMAR KAUSHIK ; SARKAR, Sankar ; AGARWAL, R. P
Integration (Amsterdam). 40(4):394-405

Electronics Electronique Sciences exactes et tech... Exact sciences and techn... Sciences appliquees Applied sciences
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34

Watermark-induced High-density via failures in submicron CMOS fabrication (May 2006)
CHEW, Alex ; HING HO AU ; HAN, S. H ; et al.
IEEE transactions on semiconductor manufacturing. 20(3):195-200

Electronics Electronique Sciences exactes et tech... Exact sciences and techn... Sciences appliquees Applied sciences
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35

Virtual qualification of moisture induced failures of advanced packages
VAN GILS, M. A. J ; VAN DRIEL, W. D ; ZHANG, G. Q ; et al.
Microelectronics and reliability. 47(2-3):273-279

Electronics Electronique Sciences exactes et tech... Exact sciences and techn... Sciences appliquees Applied sciences
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36

Verification of CDM circuit simulation using an ESD evaluation circuit
ETHERTON, M ; WILLEMEN, J ; WILKENING, W ; et al.
Microelectronics and reliability. 47(7):1036-1043

Electronics Electronique Sciences exactes et tech... Exact sciences and techn... Sciences appliquees Applied sciences
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37

Variable temperature total AC loss and stability characterization facility
PAMIDI, Sastry ; NGUYEN, Doan ; GUOMIN ZHANG ; et al.
The 2006 applied superconductivity conference, Seattle, WA, August 27-September 1, 2006. Part III of three partsIEEE transactions on applied superconductivity. 17(2):3179-3182

Electronics Electronique Electrical engineering Electrotechnique Sciences exactes et tech... Exact sciences and techn...
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38

Uniformity characteristics of Bi2212 tubes depending on cooling conditions
LEE, N. I ; JANG, G. E ; HA, D. W
The 2006 applied superconductivity conference, Seattle, WA, August 27-September 1, 2006. Part III of three partsIEEE transactions on applied superconductivity. 17(2):3008-3011

Electronics Electronique Electrical engineering Electrotechnique Sciences exactes et tech... Exact sciences and techn...
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39

UTC-PD-based optoelectronic components for high-frequency and high-speed applications
KODAMA, Satoshi ; ITO, Hiroshi
IEICE transactions on electronics. 90(2):429-435

Electronics Electronique Sciences exactes et tech... Exact sciences and techn... Sciences appliquees Applied sciences
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40

Transient voltage overshoot in TLP testing : Real or artifact?
TREMOUILLES, D ; THIJS, S ; ROUSSEL, Ph ; et al.
Microelectronics and reliability. 47(7):1016-1024

Electronics Electronique Sciences exactes et tech... Exact sciences and techn... Sciences appliquees Applied sciences
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