• Suche: "Design. Technologies. Operation analysis. Testing"

Treffer 81 - 100 von 33.594

81

Statistical placement for FPGAs considering process variation
LIN, Y ; HUTTON, M ; HE, L
IET computers & digital techniques (Print). 1(4):267-275

Electronics Electronique Computer science Informatique Telecommunications Télécommunications …
Konferenz
Zu den Favoriten
82

Stability of the maglev vehicle model using bulk high Tc superconductors at low speed
JUN ZHENG ; ZIGANG DENG ; LULIN WANG ; et al.
The 2006 applied superconductivity conference, Seattle, WA, August 27-September 1, 2006. Part II of three partsIEEE transactions on applied superconductivity. 17(2):2103-2106

Electronics Electronique Electrical engineering Electrotechnique Sciences exactes et tech... Exact sciences and techn... …
Konferenz
Zu den Favoriten
83

Stability and quench analysis of toroidal field coils for ITER
TAKAHASHI, Yoshikazu ; YOSHIDA, Kiyoshi ; NABARA, Yoshihiro ; et al.
The 2006 applied superconductivity conference, Seattle, WA, August 27-September 1, 2006. Part II of three partsIEEE transactions on applied superconductivity. 17(2):2426-2429

Electronics Electronique Electrical engineering Electrotechnique Sciences exactes et tech... Exact sciences and techn... …
Konferenz
Zu den Favoriten
84

SrHfO3 as gate dielectric for future CMOS technology
ROSSEL, C ; SOUSA, M ; GERMANN, R ; et al.
INFOS 2007: Proceedings of the 15th Biennial Conference on Insulating Films on Semiconductors, June 20-23, 2007, Glyfada Athens, GreeceMicroelectronic engineering. 84(9-10):1869-1873

Electronics Electronique Sciences exactes et tech... Exact sciences and techn... Sciences appliquees Applied sciences …
Konferenz
Zu den Favoriten
85

Some issues of hot-carrier degradation and negative bias temperature instability of advanced SOI CMOS transistors
IOANNOU, D. P ; IOANNOU, D. E
EUROSOI'06 Conference. Selected papersSolid-state electronics. 51(2):268-277

Electronics Electronique Sciences exactes et tech... Exact sciences and techn... Sciences appliquees Applied sciences …
Konferenz
Zu den Favoriten
86

Solder joints layout design and reliability enhancements of wafer level packaging using response surface methodology
LEE, Chang-Chun ; LEE, Chien-Chen ; KU, Hsiao-Tung ; et al.
Microelectronics and reliability. 47(2-3):196-204

Electronics Electronique Sciences exactes et tech... Exact sciences and techn... Sciences appliquees Applied sciences …
Konferenz
Zu den Favoriten
87

Single flux quantum circuit and packaging technology for sub-kelvin temperature operation
YOROZU, Shinichi ; MIYAZAKI, Toshiyuki ; SEMENOV, Vasili ; et al.
The 2006 applied superconductivity conference, Seattle, WA, August 27-September 1, 2006IEEE transactions on applied superconductivity. 17(2):967-970

Electronics Electronique Electrical engineering Electrotechnique Sciences exactes et tech... Exact sciences and techn... …
Konferenz
Zu den Favoriten
88

Simulation of implant free III-V MOSFETs for high performance low power Nano-CMOS applications
ASENOV, A ; KALNA, K ; THAYNE, I ; et al.
INFOS 2007: Proceedings of the 15th Biennial Conference on Insulating Films on Semiconductors, June 20-23, 2007, Glyfada Athens, GreeceMicroelectronic engineering. 84(9-10):2398-2403

Electronics Electronique Sciences exactes et tech... Exact sciences and techn... Sciences appliquees Applied sciences …
Konferenz
Zu den Favoriten
89

Silicon nanocrystal non-volatile memory for embedded memory scaling
STEIMIE, R. F ; MURALIDHAR, R ; PRINZ, E. J ; et al.
14TH Workshop on dielectrics in microelectronics (WoDiM 2006)Microelectronics and reliability. 47(4-5):585-592

Electronics Electronique Sciences exactes et tech... Exact sciences and techn... Sciences appliquees Applied sciences …
Konferenz
Zu den Favoriten
90

Selective area etching of InP with CBr4 in MOVPE
EBERT, C ; LEVKOFF, J ; ROBERTS, J ; et al.
Thirteenth International Conference on Metal Organic Vapor Phase Epitaxy (ICMOVPE-XIII), Phoenix Seagaia Resort, Miyazaki, 22-26 May 2006Journal of crystal growth. 298:94-97

Crystallography Cristallographie cristal... Geology Géologie Metallurgy, welding Métallurgie, soudage …
Konferenz
Zu den Favoriten
91

Scanning spreading resistance microscopy of defect engineered low dose SIMOX samples
VINES, Lasse ; KÖGLER, Reinhard ; KUZNETSOV, Andrej Yu
Nanoscale imaging and metrology of devices and innovative materials. Proceedings of the European Materials Research Society 2006 - Symposium F, EMRS volume 195, Nice, France, 29 May - 2 June 2006Microelectronic engineering. 84(3):547-550

Electronics Electronique Sciences exactes et tech... Exact sciences and techn... Sciences appliquees Applied sciences …
Konferenz
Zu den Favoriten
92

Scanning probe measurements on luminescent Si nanoclusters in SiO2 films
MAYANDI, J ; FINSTAD, T. G ; THOGERSEN, A ; et al.
Proceedings of Symposium J on Synthesis Processing and Characterization of Nanoscale Functional Oxide Films - EMRS 2006 Conference, Nice, May 29-June 2, 2006Thin solid films. 515(16):6375-6380

Crystallography Cristallographie cristal... Electronics Electronique Metallurgy, welding Métallurgie, soudage …
Konferenz
Zu den Favoriten
93

Scalable matrix multiplication with hybrid CMOS-RSFQ digital signal processor
KATAEVA, Irina ; ENGSETH, Henrik ; KIDIYAROVA-SHEVCHENKO, Anna
The 2006 applied superconductivity conference, Seattle, WA, August 27-September 1, 2006IEEE transactions on applied superconductivity. 17(2):486-489

Electronics Electronique Electrical engineering Electrotechnique Sciences exactes et tech... Exact sciences and techn... …
Konferenz
Zu den Favoriten
94

Sample preparation by cell guiding using negative dielectrophoresis
CHRISTENSEN, Troels Balmer ; PEDERSEN, Christian Møller ; BANG, Dang D ; et al.
Proceedings of the 32nd International Conference on Micro- and Nano-Engineering, Barcelona, 17-20 September 2006Microelectronic engineering. 84(5-8):1690-1693

Electronics Electronique Sciences exactes et tech... Exact sciences and techn... Sciences appliquees Applied sciences …
Konferenz
Zu den Favoriten
95

SCR-based ESD protection in nanometer SOI technologies
MARICHAL, Olivier ; WYBO, Geert ; VAN CAMP, Benjamin ; et al.
Microelectronics and reliability. 47(7):1060-1068

Electronics Electronique Sciences exactes et tech... Exact sciences and techn... Sciences appliquees Applied sciences …
Konferenz
Zu den Favoriten
96

Room temperature interface for RSFQ digital signal processor
ENGSETH, Henrik ; RAFIQUE, Raihan ; KATAEVA, Irina ; et al.
The 2006 applied superconductivity conference, Seattle, WA, August 27-September 1, 2006IEEE transactions on applied superconductivity. 17(2):979-982

Electronics Electronique Electrical engineering Electrotechnique Sciences exactes et tech... Exact sciences and techn... …
Konferenz
Zu den Favoriten
97

Reliability screening of high-k dielectrics based on voltage ramp stress
KERBER, A ; PANTISANO, L ; VELOSO, A ; et al.
14TH Workshop on dielectrics in microelectronics (WoDiM 2006)Microelectronics and reliability. 47(4-5):513-517

Electronics Electronique Sciences exactes et tech... Exact sciences and techn... Sciences appliquees Applied sciences …
Konferenz
Zu den Favoriten
98

Reliability of poly 3,4-ethylenedioxythiophene strain gauge
MATEIU, Ramona ; LILLEMOSE, Michael ; HANSEN, Thomas Steen ; et al.
Proceedings of the 32nd International Conference on Micro- and Nano-Engineering, Barcelona, 17-20 September 2006Microelectronic engineering. 84(5-8):1270-1273

Electronics Electronique Sciences exactes et tech... Exact sciences and techn... Sciences appliquees Applied sciences …
Konferenz
Zu den Favoriten
99

Reliability of SnPb and Pb-free flip-chips under different test conditions
SPRAUL, M ; NÜCHTER, W ; MÖLLER, A ; et al.
Microelectronics and reliability. 47(2-3):252-258

Electronics Electronique Sciences exactes et tech... Exact sciences and techn... Sciences appliquees Applied sciences …
Konferenz
Zu den Favoriten
100

Reliability of HTO based high-voltage gate stacks for flash memories
RASKIN, Yosef ; SALAMEH, Asaad ; BETEL, David ; et al.
14TH Workshop on dielectrics in microelectronics (WoDiM 2006)Microelectronics and reliability. 47(4-5):615-618

Electronics Electronique Sciences exactes et tech... Exact sciences and techn... Sciences appliquees Applied sciences …
Konferenz
Zu den Favoriten
Suchwerkzeuge: RSS-Feed abonnieren Diese Suche als E-Mail versenden Suche speichern

Filter