Treffer 1 - 20 von 349

1

A review of earth-viewing methods for in-flight assessment of modulation transfer function and noise of optical spaceborne sensors
Blanc, Philippe ; Wald, Lucien ; CEP/Sophia ; et al.

Remote sensing Image Processing and For... Modulation and Optical T... Signal to Noise Ratio Vicarious in-orbit asses... Image Quality
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2

Design of eye models used in quantitative analysis of interaction between chromatic and higher-order aberrations of eye
Zhai, Yi ; Wang, Yan ; Wang, Zhaoqi ; et al.
In Optics Communications 1 December 2014 332:89-95

Fachzeitschrift
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3

Towards dualband megapixel QWIP focal plane arrays
GUNAPALA, S. D ; BANDARA, S. V ; LIU, J. K ; et al.
QWIP 2006: proceedings of the International Workshop on Quantum Well Infrared Photodetectors, Kandy, 18-24 June 2006Infrared physics & technology. 50(2-3):217-226

Optics Optique Condensed state physics Physique de l'état conde... Sciences exactes et tech... Exact sciences and techn...
Konferenz
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4

Two-pupil synthesis of optical transfer function in the modified triangular interferometer
KIM, Soo-Gil ; KIM, Kyu-Tae ; KO, Myung-Sook
Information optics and photonics technology (Beijing, 8-11 November 2004)SPIE proceedings series. :434-444

Electronics Electronique Optics Optique Physics Physique
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5

The meaning of super-resolution
DRIGGERS, Ronald ; KRAPELS, Keith ; YOUNG, Susan
Infrared imaging systems (design, analysis, modeling, and testing XVI)Proceedings of SPIE, the International Society for Optical Engineering. :103-106

Electronics Electronique Metrology and instrument... Métrologie et instrument... Optics Optique
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6

Range performance modeling for staring focal plane array infrared detectors
DAHLBERG, Anders G. M ; HOLMGREN, Olof
Infrared imaging systems (design, analysis, modeling, and testing XVI)Proceedings of SPIE, the International Society for Optical Engineering. :81-90

Electronics Electronique Metrology and instrument... Métrologie et instrument... Optics Optique
Konferenz
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7

Practical issues with 3D-noise measurements and application to modern infrared sensors
O'SHEA, Patrick ; SOUSK, Stephen
Infrared imaging systems (design, analysis, modeling, and testing XVI)Proceedings of SPIE, the International Society for Optical Engineering. :262-271

Electronics Electronique Metrology and instrument... Métrologie et instrument... Optics Optique
Konferenz
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8

Novel high fill-factor, small pitch, reticulated InSb IR FPA design
RAWE, R ; MARTIN, C ; GARTER, M ; et al.
Infrared technology and applications XXXI (28 March-1 April 2005, Orlando, Florida, USA)Proceedings of SPIE, the International Society for Optical Engineering. :899-906

Electronics Electronique Metrology and instrument... Métrologie et instrument... Optics Optique
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9

NV-THERM based sensor effects for imaging simulations
TOMKINSON, David ; WILHELM, Teresa ; FLUG, Eric ; et al.
Infrared imaging systems (design, analysis, modeling, and testing XVI)Proceedings of SPIE, the International Society for Optical Engineering. :157-169

Electronics Electronique Metrology and instrument... Métrologie et instrument... Optics Optique
Konferenz
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10

MTF in digital holography
MATCZAK, Marek J ; PYZIAK, Leszek
Photonics applications in astronomy, communications, industry, and high-energy physics experiments III (Wilga, 26-30 May 2004)SPIE proceedings series. :297-303

Electronics Electronique Metrology and instrument... Métrologie et instrument... Optics Optique
Konferenz
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11

Latent holographic image dynamics in the dichromated gelatin films
NEUPOKOEVA, Anna V ; MALOV, Alexander N
Fundamental problems of optoelectronics and microelectronics II (13-16 September 2004, Khabarovsk, Russia)Proceedings of SPIE, the International Society for Optical Engineering. :110-114

Electronics Electronique Optics Optique Physics Physique
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12

Increased depth of field with phase-only filters : ambiguity function
CASTRO, Albertina ; OJEDA-CASTANEDA, J
Opto-Ireland 2005 (photonic engineering)0Photonic engineering. :1-11

Electronics Electronique Optics Optique Physics Physique
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13

InAs/(GaIn)Sb short-period superlattices for focal plane arrays
REHM, Robert ; WALTHER, Martin ; SCHMITZ, Johannes ; et al.
Infrared technology and applications XXXI (28 March-1 April 2005, Orlando, Florida, USA)Proceedings of SPIE, the International Society for Optical Engineering. :123-130

Electronics Electronique Metrology and instrument... Métrologie et instrument... Optics Optique
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14

Image recovering for sparse-aperture systems
QUANYING WU ; LIN QIAN ; WEIMIN SHEN
Information optics and photonics technology (Beijing, 8-11 November 2004)SPIE proceedings series. :478-486

Electronics Electronique Optics Optique Physics Physique
Konferenz
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15

Comparison between the effective pictorial information capacities of JPEG 6b and 2000
JENKIN, R. B ; RICHARDSON, M. A
Opto-Ireland 2005 (imaging and vision)0Imaging and vision. :13-19

Electronics Electronique Optics Optique Physics Physique
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16

Angular-motion OTF model
KLAPP, Iftah ; YITZHAKY, Yitzhak
Optical scanning 2005 (31 July-1 August 2005, San Diego, California, USA)Proceedings of SPIE, the International Society for Optical Engineering. :171-182

Electronics Electronique Metrology and instrument... Métrologie et instrument... Optics Optique
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17

Advanced test systems for production testing of cameras with day/night and visible/NIR capabilities
BRYANT, Tim ; IRWIN, Alan ; BRYANT, Paul ; et al.
Infrared imaging systems (design, analysis, modeling, and testing XVI)Proceedings of SPIE, the International Society for Optical Engineering. :309-315

Electronics Electronique Metrology and instrument... Métrologie et instrument... Optics Optique
Konferenz
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18

A Range/Depth Modulation Transfer Function (RMTF) framework for Characterizing 3D Imaging LADAR Performance
STAPLE, Bevan ; EARHART, R. Patrick ; SLAYMAKER, Philip A ; et al.
Laser radar technology and applications X (30 March-1 April 2005, Orlando, Florida, USA)Proceedings of SPIE, the International Society for Optical Engineering. :226-237

Electronics Electronique Metrology and instrument... Métrologie et instrument... Optics Optique
Konferenz
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19

1024x1024 pixel MWIR and LWIR QWIP focal plane arrays and 320x256 MWIR:LWIR pixel colocated simultaneous dualband QWIP focal plane arrays
GUNAPALA, S. D ; BANDARA, S. V ; LIU, J. K ; et al.
Infrared technology and applications XXXI (28 March-1 April 2005, Orlando, Florida, USA)Proceedings of SPIE, the International Society for Optical Engineering. :789-803

Electronics Electronique Metrology and instrument... Métrologie et instrument... Optics Optique
Konferenz
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20

Speckle photography combined with speckle interferometry
MOLIN, N.-E ; SJÖDAHL, M ; GREN, P ; et al.
Fringe analysisOptics and lasers in engineering. 41(4):673-686

Electronics Electronique Optics Optique Telecommunications Télécommunications
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