Treffer 81 - 100 von 139.102

81

Virtual qualification of moisture induced failures of advanced packages
VAN GILS, M. A. J ; VAN DRIEL, W. D ; ZHANG, G. Q ; et al.
Microelectronics and reliability. 47(2-3):273-279

Electronics Electronique Sciences exactes et tech... Exact sciences and techn... Sciences appliquees Applied sciences
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82

Vibrational energy scavenging with Si technology electromagnetic inertial microgenerators
SERRE, Christophe ; PEREZ-RODRIGUEZ, Alejandro ; FONDEVILLA, Nuria ; et al.
Symposium on Design, Test, Integration, and packaging of MEMS/MOEMS, Stresa, Italy, 26-28 April 2006Microsystem technologies. 13(11-12):1655-1661

Electronics Electronique Mechanical engineering Génie mécanique Metrology and instrument... Métrologie et instrument...
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83

Vertical co-integration of AlSi MEMS tunable capacitors and Cu inductors for tunable LC blocks
MEHDAOUI, A ; PISANI, M. B ; FRITSCHI, R ; et al.
Proceedings of the 32nd International Conference on Micro- and Nano-Engineering, Barcelona, 17-20 September 2006Microelectronic engineering. 84(5-8):1369-1373

Electronics Electronique Sciences exactes et tech... Exact sciences and techn... Sciences appliquees Applied sciences
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84

Verification of CDM circuit simulation using an ESD evaluation circuit
ETHERTON, M ; WILLEMEN, J ; WILKENING, W ; et al.
Microelectronics and reliability. 47(7):1036-1043

Electronics Electronique Sciences exactes et tech... Exact sciences and techn... Sciences appliquees Applied sciences
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85

Variable temperature total AC loss and stability characterization facility
PAMIDI, Sastry ; NGUYEN, Doan ; GUOMIN ZHANG ; et al.
The 2006 applied superconductivity conference, Seattle, WA, August 27-September 1, 2006. Part III of three partsIEEE transactions on applied superconductivity. 17(2):3179-3182

Electronics Electronique Electrical engineering Electrotechnique Sciences exactes et tech... Exact sciences and techn...
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86

Van Hove singularities in intersubband transitions in multiquantum well photodetectors
LE ROUZO, J ; RIBET-MOHAMED, I ; HAIDAR, R ; et al.
QWIP 2006: proceedings of the International Workshop on Quantum Well Infrared Photodetectors, Kandy, 18-24 June 2006Infrared physics & technology. 50(2-3):113-118

Optics Optique Condensed state physics Physique de l'état conde... Sciences exactes et tech... Exact sciences and techn...
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87

Value-added metrology
BUNDAY, Benjamin D ; ALLGAIR, John A ; CALDWELL, Mark ; et al.
IEEE transactions on semiconductor manufacturing. 20(3):266-277

Electronics Electronique Sciences exactes et tech... Exact sciences and techn... Sciences appliquees Applied sciences
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88

Validation of the DJOSER analytical thermal simulator for electronic power devices and assembling structures
BAGNOLI, Paolo Emilio ; BARTOLI, Carlo ; STEFANI, Fabio
Microelectronics journal. 38(2):185-196

Electronics Electronique Sciences exactes et tech... Exact sciences and techn... Sciences appliquees Applied sciences
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89

Vacuum, temperature, and time dependencies of field-emission current for RF-MEMS applications
YAMASHITA, Kiyotaka ; SUN, Winston ; CHARIOT, Benoit ; et al.
Proceedings of the 32nd International Conference on Micro- and Nano-Engineering, Barcelona, 17-20 September 2006Microelectronic engineering. 84(5-8):1345-1353

Electronics Electronique Sciences exactes et tech... Exact sciences and techn... Sciences appliquees Applied sciences
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90

VSP: A gate stack analyzer
KARNER, M ; GEHRING, A ; WAGNER, M ; et al.
14TH Workshop on dielectrics in microelectronics (WoDiM 2006)Microelectronics and reliability. 47(4-5):704-708

Electronics Electronique Sciences exactes et tech... Exact sciences and techn... Sciences appliquees Applied sciences
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91

VCM design with round coil and axe-shaped magnet for hard disk drive actuator
SUZUKI, Kenji ; TSUDA, Shingo ; DEGUCHI, Takaaki ; et al.
ASME/ISPS/JSME-IIP Joint conference on micromechatronics for information and precision equipment, Santa Clara, California, USA, 2006Microsystem technologies. 13(8-10):1093-1101

Electronics Electronique Mechanical engineering Génie mécanique Metrology and instrument... Métrologie et instrument...
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92

Utilizing nonlinearity in a superconducting NbN stripline resonator for radiation detection
SEGEV, Eran ; ABDO, Baleegh ; SHTEMPLUCK, Oleg ; et al.
The 2006 applied superconductivity conference, Seattle, WA, August 27-September 1, 2006IEEE transactions on applied superconductivity. 17(2):271-274

Electronics Electronique Electrical engineering Electrotechnique Sciences exactes et tech... Exact sciences and techn...
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93

Uniformity characteristics of Bi2212 tubes depending on cooling conditions
LEE, N. I ; JANG, G. E ; HA, D. W
The 2006 applied superconductivity conference, Seattle, WA, August 27-September 1, 2006. Part III of three partsIEEE transactions on applied superconductivity. 17(2):3008-3011

Electronics Electronique Electrical engineering Electrotechnique Sciences exactes et tech... Exact sciences and techn...
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94

Uniformity analysis of wafer scale sub-25 nm wide nanowire array nanoimprint mold fabricated by PEDAL process
SONKUSALE, Sachin R ; DI SPIGNA, Neil H ; FRANZON, Paul D
Proceedings of the 32nd International Conference on Micro- and Nano-Engineering, Barcelona, 17-20 September 2006Microelectronic engineering. 84(5-8):1523-1527

Electronics Electronique Sciences exactes et tech... Exact sciences and techn... Sciences appliquees Applied sciences
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95

Uniform hot-wall MOCVD epitaxial growth of 2 inch AlGaN/GaN HEMT structures
KAKANAKOVA -GEORGIEVA, A ; FORSBERG, U ; IVANOV, I. G ; et al.
First International Symposium on Growth of Nitrides (ISGN-1), Linköping, 4-7 June 2006Journal of crystal growth. 300(1):100-103

Crystallography Cristallographie cristal... Geology Géologie Metallurgy, welding Métallurgie, soudage
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96

Uniaxially strained silicon by wafer bonding and layer transfer
HIMCINSCHI, C ; RADU, I ; MUSTER, F ; et al.
EUROSOI'06 Conference. Selected papersSolid-state electronics. 51(2):226-230

Electronics Electronique Sciences exactes et tech... Exact sciences and techn... Sciences appliquees Applied sciences
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97

Understanding of the thermal stability of the hafnium oxide/TiN stack via 2 high k and 2 metal deposition techniques
COSNIER, V ; BESSON, P ; MORIN, C ; et al.
INFOS 2007: Proceedings of the 15th Biennial Conference on Insulating Films on Semiconductors, June 20-23, 2007, Glyfada Athens, GreeceMicroelectronic engineering. 84(9-10):1886-1889

Electronics Electronique Sciences exactes et tech... Exact sciences and techn... Sciences appliquees Applied sciences
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98

Ultrasensitive quantum-limited far-infrared STJ detectors
PROBER, D. E ; TEUFEL, J. D ; WILSON, C. M ; et al.
The 2006 applied superconductivity conference, Seattle, WA, August 27-September 1, 2006IEEE transactions on applied superconductivity. 17(2):241-245

Electronics Electronique Electrical engineering Electrotechnique Sciences exactes et tech... Exact sciences and techn...
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99

Ultrafast photoresponse dynamics of current-biasec Hg-Ba-Ca-Cu-O superconducting microbridges
LI, X ; KHAFIZOV, M ; CHROMIK, S ; et al.
The 2006 applied superconductivity conference, Seattle, WA, August 27-September 1, 2006. Part III of three partsIEEE transactions on applied superconductivity. 17(2):3648-3651

Electronics Electronique Electrical engineering Electrotechnique Sciences exactes et tech... Exact sciences and techn...
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100

Ultra-thin fully-depleted SOI MOSFETs : Special charge properties and coupling effects
EMINENTE, S ; CRISTOLOVEANU, S ; CLERC, R ; et al.
EUROSOI'06 Conference. Selected papersSolid-state electronics. 51(2):239-244

Electronics Electronique Sciences exactes et tech... Exact sciences and techn... Sciences appliquees Applied sciences
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