Serviceeinschränkungen vom 12.-22.02.2026 - weitere Infos auf der UB-Homepage
American Psychological Association 6th edition

Kachi, T., Narita, T., Sakurai, H., Matys, M., Kataoka, K., Hirukawa, K., Sumida, K., Horita, M., Ikarashi, N., Sierakowski, K., Bockowski, M., & Suda, J. (2022). Process engineering of Ga N power devices via selective-area p-type doping with ion implantation and ultra-high-pressure annealing. Journal of Applied Physics, 132(13), 1-14. https://doi.org/10.1063/5.0107921

ISO-690 (author-date, English)

KACHI, Tetsu, NARITA, Tetsuo, SAKURAI, Hideki, MATYS, Maciej, KATAOKA, Keita, HIRUKAWA, Kazufumi, SUMIDA, Kensuke, HORITA, Masahiro, IKARASHI, Nobuyuki, SIERAKOWSKI, Kacper, BOCKOWSKI, Michal und SUDA, Jun, 2022. Process engineering of Ga N power devices via selective-area p-type doping with ion implantation and ultra-high-pressure annealing. Journal of Applied Physics. 7 Oktober 2022. Vol. 132, no. 13, p. 1-14. DOI 10.1063/5.0107921.

Modern Language Association 9th edition

Kachi, T., T. Narita, H. Sakurai, M. Matys, K. Kataoka, K. Hirukawa, K. Sumida, M. Horita, N. Ikarashi, K. Sierakowski, M. Bockowski, und J. Suda. „Process Engineering of Ga N Power Devices via Selective-Area P-Type Doping With Ion Implantation and Ultra-High-Pressure Annealing.“. Journal of Applied Physics, Bd. 132, Nr. 13, Oktober 2022, S. 1-14, https://doi.org/10.1063/5.0107921.

Mohr Siebeck - Recht (Deutsch - Österreich)

Kachi, Tetsu/Narita, Tetsuo/Sakurai, Hideki/Matys, Maciej/Kataoka, Keita/Hirukawa, Kazufumi u. a.: Process engineering of Ga N power devices via selective-area p-type doping with ion implantation and ultra-high-pressure annealing., Journal of Applied Physics 2022, 1-14.

Emerald - Harvard

Kachi, T., Narita, T., Sakurai, H., Matys, M., Kataoka, K., Hirukawa, K., Sumida, K., Horita, M., Ikarashi, N., Sierakowski, K., Bockowski, M. und Suda, J. (2022), „Process engineering of Ga N power devices via selective-area p-type doping with ion implantation and ultra-high-pressure annealing.“, Journal of Applied Physics, Vol. 132 No. 13, S. 1-14.

Achtung: Diese Zitate sind unter Umständen nicht zu 100% korrekt.