Treffer: Synchronization Instability of Inverter-Based Generation During Asymmetrical Grid Faults.

Title:
Synchronization Instability of Inverter-Based Generation During Asymmetrical Grid Faults.
Authors:
He, Xiuqiang1 (AUTHOR) hxq19@tsinghua.org.cn, He, Changjun1 (AUTHOR) hcj20@mails.tsinghua.edu.cn, Pan, Sisi2 (AUTHOR) pss970503@icloud.com, Geng, Hua1 (AUTHOR) genghua@tsinghua.edu.cn, Liu, Feng3 (AUTHOR) lfeng@tsinghua.edu.cn
Source:
IEEE Transactions on Power Systems. Mar2022, Vol. 37 Issue 2, p1018-1031. 14p.
Database:
Business Source Premier

Weitere Informationen

The transient stability of traditional power systems is concerned with the ability of generators to stay synchronized with the positive-sequence voltage of the network, whether for symmetrical or asymmetrical faults. In contrast, both positive- and negative-sequence synchronizations should be of concern for inverter-based generation (IBG) under asymmetrical faults. This is because the latest grid codes stipulate that IBG should inject dual-sequence current when riding through asymmetrical faults. Currently, much less is known about the synchronization stability during asymmetrical faults. This significantly differs from the positive-sequence synchronization alone because the coupled dual-sequence synchronization is involved. This paper aims to fill this gap. Considering the sequence coupling under asymmetrical faults, the dual-sequence synchronization model of IBG is developed. Based on the model, the conditions that steady-state equilibrium points should follow are identified. The conditions throw light on the possible types of synchronization instability, including the positive-sequence dominated instability and the negative-sequence dominated one. For different types of instability, the dominant factors are analyzed quantitatively, which are reflected by the limit on the current injection amplitude. Exceeding the limit will lead to the loss of both positive- and negative-sequence synchronizations. The model and the analysis are verified by simulations and hardware-in-the-loop experiments. [ABSTRACT FROM AUTHOR]

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