Treffer: A New Synthetic Triple Sampling X̅ Control Chart.

In this study, the synthetic triple sampling (STS) X ¯ chart is introduced to monitor the process mean more effectively. The developed STS X ¯ chart combines the triple sampling (TS) X ¯ chart and the conforming run length (CRL) chart to enhance shift detection capabilities. The performance of the STS X ¯ chart is compared with that of the TS X ¯ and synthetic double sampling (SDS) X ¯ charts on the basis of the average number of observations to signal (ANOS) and expected ANOS (EANOS) as key performance metrics. Results show that the process shift detection effectiveness of the STS X ¯ chart is generally superior to that of the TS X ¯ and SDS X ¯ charts. Real industrial data are adopted to demonstrate the implementation of the STS X ¯ chart. [ABSTRACT FROM AUTHOR]

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