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American Psychological Association 6th edition

Chen, J. C., Sun, C.-J., & Chen, T.-L. (2015). Capacity planning for integrated circuit final test plants. International Journal of Computer Integrated Manufacturing, 28(12), 1262-1274. https://doi.org/10.1080/0951192 X.2014.964324

ISO-690 (author-date, English)

CHEN, James C., SUN, Cheng-Ju und CHEN, Tzu-Li, 2015. Capacity planning for integrated circuit final test plants. International Journal of Computer Integrated Manufacturing. 1 Dezember 2015. Vol. 28, no. 12, p. 1262-1274. DOI 10.1080/0951192 X.2014.964324.

Modern Language Association 9th edition

Chen, J. C., C.-J. Sun, und T.-L. Chen. „Capacity Planning for Integrated Circuit Final Test Plants.“. International Journal of Computer Integrated Manufacturing, Bd. 28, Nr. 12, Dezember 2015, S. 1262-74, https://doi.org/10.1080/0951192 X.2014.964324.

Mohr Siebeck - Recht (Deutsch - Österreich)

Chen, James C./Sun, Cheng-Ju/Chen, Tzu-Li: Capacity planning for integrated circuit final test plants., International Journal of Computer Integrated Manufacturing 2015, 1262-1274.

Emerald - Harvard

Chen, J.C., Sun, C.-J. und Chen, T.-L. (2015), „Capacity planning for integrated circuit final test plants.“, International Journal of Computer Integrated Manufacturing, Vol. 28 No. 12, S. 1262-1274.

Achtung: Diese Zitate sind unter Umständen nicht zu 100% korrekt.