Treffer: Predicting the number of defects in a new software version.

Title:
Predicting the number of defects in a new software version.
Authors:
Felix EA; Faculty of Computer Science and Information Technology, University of Malaya, Kuala Lumpur, Malaysia., Lee SP; Faculty of Computer Science and Information Technology, University of Malaya, Kuala Lumpur, Malaysia.
Source:
PloS one [PLoS One] 2020 Mar 18; Vol. 15 (3), pp. e0229131. Date of Electronic Publication: 2020 Mar 18 (Print Publication: 2020).
Publication Type:
Journal Article; Research Support, Non-U.S. Gov't
Language:
English
Journal Info:
Publisher: Public Library of Science Country of Publication: United States NLM ID: 101285081 Publication Model: eCollection Cited Medium: Internet ISSN: 1932-6203 (Electronic) Linking ISSN: 19326203 NLM ISO Abbreviation: PLoS One Subsets: MEDLINE
Imprint Name(s):
Original Publication: San Francisco, CA : Public Library of Science
References:
IEEE Trans Neural Netw. 2002;13(1):143-59. (PMID: 18244416)
Comput Methods Programs Biomed. 2016 Jul;130:54-64. (PMID: 27208521)
Entry Date(s):
Date Created: 20200319 Date Completed: 20200617 Latest Revision: 20200617
Update Code:
20250114
PubMed Central ID:
PMC7080245
DOI:
10.1371/journal.pone.0229131
PMID:
32187181
Database:
MEDLINE

Weitere Informationen

Predicting the number of defects in software at the method level is important. However, little or no research has focused on method-level defect prediction. Therefore, considerable efforts are still required to demonstrate how method-level defect prediction can be achieved for a new software version. In the current study, we present an analysis of the relevant information obtained from the current version of a software product to construct regression models to predict the estimated number of defects in a new version using the variables of defect density, defect velocity and defect introduction time, which show considerable correlation with the number of method-level defects. These variables also show a mathematical relationship between defect density and defect acceleration at the method level, further indicating that the increase in the number of defects and the defect density are functions of the defect acceleration. We report an experiment conducted on the Finding Faults Using Ensemble Learners (ELFF) open-source Java projects, which contain 289,132 methods. The results show correlation coefficients of 60% for the defect density, -4% for the defect introduction time, and 93% for the defect velocity. These findings indicate that the average defect velocity shows a firm and considerable correlation with the number of defects at the method level. The proposed approach also motivates an investigation and comparison of the average performances of classifiers before and after method-level data preprocessing and of the level of entropy in the datasets.

This research was funded by the Ministry of Education under a University of Malaya High Impact Research grant (UM.C/625/1/HIR/MOHE/FCSIT/13).