Serviceeinschränkungen vom 12.-22.02.2026 - weitere Infos auf der UB-Homepage

Treffer: Automatic analysis of inefficiency patterns in parallel applications.

Title:
Automatic analysis of inefficiency patterns in parallel applications.
Source:
Concurrency & Computation: Practice & Experience; Aug2007, Vol. 19 Issue 11, p1481-1496, 16p, 2 Color Photographs, 4 Diagrams, 1 Chart
Database:
Complementary Index

Weitere Informationen

Event tracing is a powerful method for analyzing the performance behavior of parallel applications. Because event traces record the temporal and spatial relationships between individual runtime events, they allow application developers to analyze dependences of performance phenomena across concurrent control flows. However, in view of the large amounts of data generated on contemporary parallel machines, the depth and coverage of a purely manual analysis is often limited. Our approach automatically searches event traces for patterns of inefficient behavior, classifies detected instances by category, and quantifies the associated performance penalty. This enables developers to study the performance of their applications at a high level of abstraction, while requiring significantly less time and expertise than a manual analysis. Copyright © 2006 John Wiley & Sons, Ltd. [ABSTRACT FROM AUTHOR]

Copyright of Concurrency & Computation: Practice & Experience is the property of Wiley-Blackwell and its content may not be copied or emailed to multiple sites without the copyright holder's express written permission. Additionally, content may not be used with any artificial intelligence tools or machine learning technologies. However, users may print, download, or email articles for individual use. This abstract may be abridged. No warranty is given about the accuracy of the copy. Users should refer to the original published version of the material for the full abstract. (Copyright applies to all Abstracts.)