Chien, C.-F., Hung, W.-T., & Liao, E. T.-Y. (2022). Redefining Monitoring Rules for Intelligent Fault Detection and Classification via CNN Transfer Learning for Smart Manufacturing. IEEE Transactions on Semiconductor Manufacturing, 35(2), 158-165. https://doi.org/10.1109/TSM.2022.3164904
ISO-690 (author-date, English)CHIEN, Chen-Fu, HUNG, Wei-Tse und LIAO, Eddy Ting-Yi, 2022. Redefining Monitoring Rules for Intelligent Fault Detection and Classification via CNN Transfer Learning for Smart Manufacturing. IEEE Transactions on Semiconductor Manufacturing. 1 Mai 2022. Vol. 35, no. 2, p. 158-165. DOI 10.1109/TSM.2022.3164904.
Modern Language Association 9th editionChien, C.-F., W.-T. Hung, und E. T.-Y. Liao. „Redefining Monitoring Rules for Intelligent Fault Detection and Classification via CNN Transfer Learning for Smart Manufacturing.“. IEEE Transactions on Semiconductor Manufacturing, Bd. 35, Nr. 2, Mai 2022, S. 158-65, https://doi.org/10.1109/TSM.2022.3164904.
Mohr Siebeck - Recht (Deutsch - Österreich)Chien, Chen-Fu/Hung, Wei-Tse/Liao, Eddy Ting-Yi: Redefining Monitoring Rules for Intelligent Fault Detection and Classification via CNN Transfer Learning for Smart Manufacturing., IEEE Transactions on Semiconductor Manufacturing 2022, 158-165.
Emerald - HarvardChien, C.-F., Hung, W.-T. und Liao, E.T.-Y. (2022), „Redefining Monitoring Rules for Intelligent Fault Detection and Classification via CNN Transfer Learning for Smart Manufacturing.“, IEEE Transactions on Semiconductor Manufacturing, Vol. 35 No. 2, S. 158-165.