American Psychological Association 6th edition

Wi, T., Yang, M., Park, S., & Jeong, J. (2024). D 2 -SPDM: Faster R-CNN-Based Defect Detection and Surface Pixel Defect Mapping with Label Enhancement in Steel Manufacturing Processes. Applied Sciences (2076-3417), 14(21), 9836-9855. https://doi.org/10.3390/app14219836

ISO-690 (author-date, English)

WI, Taewook, YANG, Minyeol, PARK, Suyeon und JEONG, Jongpil, 2024. D 2 -SPDM: Faster R-CNN-Based Defect Detection and Surface Pixel Defect Mapping with Label Enhancement in Steel Manufacturing Processes. Applied Sciences (2076-3417). 1 November 2024. Vol. 14, no. 21, p. 9836-9855. DOI 10.3390/app14219836.

Modern Language Association 9th edition

Wi, T., M. Yang, S. Park, und J. Jeong. „D 2 -SPDM: Faster R-CNN-Based Defect Detection and Surface Pixel Defect Mapping With Label Enhancement in Steel Manufacturing Processes.“. Applied Sciences (2076-3417), Bd. 14, Nr. 21, November 2024, S. 9836-55, https://doi.org/10.3390/app14219836.

Mohr Siebeck - Recht (Deutsch - Österreich)

Wi, Taewook/Yang, Minyeol/Park, Suyeon/Jeong, Jongpil: D 2 -SPDM: Faster R-CNN-Based Defect Detection and Surface Pixel Defect Mapping with Label Enhancement in Steel Manufacturing Processes., Applied Sciences (2076-3417) 2024, 9836-9855.

Emerald - Harvard

Wi, T., Yang, M., Park, S. und Jeong, J. (2024), „D 2 -SPDM: Faster R-CNN-Based Defect Detection and Surface Pixel Defect Mapping with Label Enhancement in Steel Manufacturing Processes.“, Applied Sciences (2076-3417), Vol. 14 No. 21, S. 9836-9855.

Achtung: Diese Zitate sind unter Umständen nicht zu 100% korrekt.