Rapid Autotuning of a SiGe Quantum Dot into the Single-Electron Regime with Machine Learning and RF-Reflectometry FPGA-Based Measurements - Roux, Marc-Antoine; Rivard, Joffrey; Yon, Victor; Morel, Alexis; Leclerc, Dominic; Rohrbacher, Claude; Ndiaye, El Bachir; Tafuri, Felice Francesco; Bono, Brendan; Kubicek, Stefan; Loo, Roger; Shimura, Yosuke; et al. (https://hal.science/hal-05330586 ; 2025, 2025)