Treffer: Device technology limitations in monolithic switched-capacitor Σ-Δ modulators
Title:
Device technology limitations in monolithic switched-capacitor Σ-Δ modulators
Authors:
Source:
ADC modelling and testingMeasurement. 31(1):3-14
Publisher Information:
Oxford: Elsevier, 2002.
Publication Year:
2002
Physical Description:
print, 19 ref
Original Material:
INIST-CNRS
Subject Terms:
Physics, Physique, Sciences exactes et technologie, Exact sciences and technology, Physique, Physics, Generalites, General, Instruments, appareillage, composants et techniques communs à plusieurs branches de la physique et de l'astronomie, Instruments, apparatus, components and techniques common to several branches of physics and astronomy, Informatique en physique expérimentale, Computers in experimental physics, Modélisation et simulation par ordinateur, Computer modeling and simulation, Méthodes et appareillages électroniques et électriques, Electrical and electronic components, instruments and techniques, Circuits et composants de circuit, Circuits ans circuit components, Sciences appliquees, Applied sciences, Telecommunications et theorie de l'information, Telecommunications and information theory, Théorie de l'information, du signal et des communications, Information, signal and communications theory, Théorie du signal et des communications, Signal and communications theory, Conversion an, conversion na, codage mic, Analog-digital conversion, digital-analog conversion, pcm coding, Circuits and circuit components, Circuit analogique, Analogue circuits, Circuit capacité commutée, Switched capacitor networks, Circuit intégré monolithique, Monolithic integrated circuits, Conception assistée, Computer aided design, Convertisseur analogique numérique, Analog to digital converters, Défaut, Defects, Modulation sigma delta, Sigma-delta modulation, Modélisation, Modelling, Simulation
Document Type:
Konferenz
Conference Paper
File Description:
text
Language:
English
Author Affiliations:
Naval Undersea Warfare Center, Newport, RI 02841-1708, United States
University of Rhode Island, Kingston, RI 02881-0805, United States
University of Rhode Island, Kingston, RI 02881-0805, United States
ISSN:
0263-2241
Rights:
Copyright 2002 INIST-CNRS
CC BY 4.0
Sauf mention contraire ci-dessus, le contenu de cette notice bibliographique peut être utilisé dans le cadre d’une licence CC BY 4.0 Inist-CNRS / Unless otherwise stated above, the content of this bibliographic record may be used under a CC BY 4.0 licence by Inist-CNRS / A menos que se haya señalado antes, el contenido de este registro bibliográfico puede ser utilizado al amparo de una licencia CC BY 4.0 Inist-CNRS
CC BY 4.0
Sauf mention contraire ci-dessus, le contenu de cette notice bibliographique peut être utilisé dans le cadre d’une licence CC BY 4.0 Inist-CNRS / Unless otherwise stated above, the content of this bibliographic record may be used under a CC BY 4.0 licence by Inist-CNRS / A menos que se haya señalado antes, el contenido de este registro bibliográfico puede ser utilizado al amparo de una licencia CC BY 4.0 Inist-CNRS
Notes:
Metrology
Telecommunications and information theory
Telecommunications and information theory
Accession Number:
edscal.13420907
Database:
PASCAL Archive
Weitere Informationen
This paper analyzes non-ideal effects and fundamental limitations encountered in Σ-Δ analog-to-digital converters realized by switched-capacitor techniques. Expressions are derived for the lower noise bound as a function of the modulator network structure. Circuit imperfections and device limitations are simulated using a behavioral model. The theoretical results are compared to simulations and actual measurements performed with monolithic implementations of the MASH and the iflf5 network structures. The circuits are implemented in a 2.0 and a 1.2 μm double-poly CMOS process, respectively.