Result: Optimization problems in the estimation of parameters of thin films and the elimination of the influence of the substrate

Title:
Optimization problems in the estimation of parameters of thin films and the elimination of the influence of the substrate
Source:
Proceedings of the international conference on recent advances in computational mathematics (ICRACM 2001), Matsuyama, Japan, 10-13 October 2001Journal of computational and applied mathematics. 152(1-2):35-50
Publisher Information:
Amsterdam: Elsevier, 2003.
Publication Year:
2003
Physical Description:
print, 14 ref
Original Material:
INIST-CNRS
Subject Terms:
Computer science, Informatique, Mathematics, Mathématiques, Sciences exactes et technologie, Exact sciences and technology, Sciences et techniques communes, Sciences and techniques of general use, Mathematiques, Mathematics, Analyse mathématique, Mathematical analysis, Calcul des variations et contrôle optimal, Calculus of variations and optimal control, Analyse numérique. Calcul scientifique, Numerical analysis. Scientific computation, Analyse numérique, Numerical analysis, Méthodes numériques en programmation mathématique, optimisation et calcul variationnel, Numerical methods in mathematical programming, optimization and calculus of variations, Physique, Physics, Domaines classiques de la physique (y compris les applications), Fundamental areas of phenomenology (including applications), Optique, Optics, Optique physique, Wave optics, Sciences appliquees, Applied sciences, Recherche operationnelle. Gestion, Operational research. Management science, Recherche opérationnelle et modèles formalisés de gestion, Operational research and scientific management, Programmation mathématique, Mathematical programming, Absorption, Absorción, Approximation numérique, Numerical approximation, Aproximación numérica, Couche mince, Thin film, Capa fina, Estimation paramètre, Parameter estimation, Estimación parámetro, Fiabilité, Reliability, Fiabilidad, Méthode itérative, Iterative method, Método iterativo, Méthode optimisation, Optimization method, Método optimización, Méthode plus grande pente, Steepest descent method, Método más grande inclinación, Optimisation, Optimization, Optimización, Optique physique, Physical optics, Programmation mathématique, Mathematical programming, Programación matemática, Programmation non linéaire, Non linear programming, Programación no lineal, Substrat, Substrate, Substrato
Document Type:
Conference Conference Paper
File Description:
text
Language:
English
Author Affiliations:
Department of Computer Sciences IME-USP, University of São Paulo, Rua do Matão 1010, Cidade Universitária, São Paulo, SP 05508-090, Brazil
Department of Applied Physics, Institute of Physics, University of Campinas, CP 6065, Campinas, SP 13083-970, Brazil
Department of Applied Mathematics IMECC-UNICAMP, University of Campinas, CP 6065, Campinas, SP 13081-970, Brazil
ISSN:
0377-0427
Rights:
Copyright 2003 INIST-CNRS
CC BY 4.0
Sauf mention contraire ci-dessus, le contenu de cette notice bibliographique peut être utilisé dans le cadre d’une licence CC BY 4.0 Inist-CNRS / Unless otherwise stated above, the content of this bibliographic record may be used under a CC BY 4.0 licence by Inist-CNRS / A menos que se haya señalado antes, el contenido de este registro bibliográfico puede ser utilizado al amparo de una licencia CC BY 4.0 Inist-CNRS
Notes:
Mathematics

Operational research. Management

Physics: optics
Accession Number:
edscal.14651865
Database:
PASCAL Archive

Further Information

In a recent paper, the authors introduced a method to estimate optical parameters of thin films using transmission data. The associated model assumes that the film is deposited on a completely transparent substrate. It has been observed, however, that small absorption of substrates affect in a nonnegligible way the transmitted energy. The question arises of the reliability of the estimation method to retrieve optical parameters in the presence of substrates of different thicknesses and absorption degrees. In this paper, transmission spectra of thin films deposited on non-transparent substrates are generated and, as a first approximation, the method based on transparent substrates is used to estimate the optical parameters. As expected, the method is good when the absorption of the substrate is very small, but fails when one deals with less transparent substrates. To overcome this drawback, an iterative procedure is introduced, that allows one to approximate the transmittance with transparent substrate, given the transmittance with absorbent substrate. The updated method turns out to be almost as efficient in the case of absorbent substrates as it was in the case of transparent ones.