Result: Duality method for limit analysis of dielectrics in powerful electric fields
Title:
Duality method for limit analysis of dielectrics in powerful electric fields
Authors:
Source:
Selected papers from the 2nd International Conference on Advanced Computational Methods in Engineering (ACOMEN2002), Liege, Belgium, 27-31 May 2002Journal of computational and applied mathematics. 168(1-2):87-94
Publisher Information:
Amsterdam: Elsevier, 2004.
Publication Year:
2004
Physical Description:
print, 16 ref
Original Material:
INIST-CNRS
Subject Terms:
Computer science, Informatique, Mathematics, Mathématiques, Sciences exactes et technologie, Exact sciences and technology, Sciences et techniques communes, Sciences and techniques of general use, Mathematiques, Mathematics, Analyse mathématique, Mathematical analysis, Calcul des variations et contrôle optimal, Calculus of variations and optimal control, Analyse numérique. Calcul scientifique, Numerical analysis. Scientific computation, Analyse numérique, Numerical analysis, Méthodes numériques en programmation mathématique, optimisation et calcul variationnel, Numerical methods in mathematical programming, optimization and calculus of variations, Optimisation et calcul variationnel numériques, Numerical methods in optimization and calculus of variations, Analyse limite, Limit analysis, Análisis límite, Analyse numérique, Numerical analysis, Análisis numérico, Approximation linéaire, Linear approximation, Aproximación lineal, Champ électrique, Electric field, Campo eléctrico, Mathématiques appliquées, Applied mathematics, Matemáticas aplicadas, Méthode gradient, Gradient method, Método gradiente, Méthode projection, Projection method, Método proyección, Méthode élément fini, Finite element method, Método elemento finito, Programmation linéaire, Linear programming, Programación lineal, Programmation mathématique, Mathematical programming, Programación matemática
Document Type:
Conference
Conference Paper
File Description:
text
Language:
English
Author Affiliations:
Department of Computer Science, North-Western State Technical University, Millionnaya 5, St. Petersburg 191186, Russian Federation
ISSN:
0377-0427
Rights:
Copyright 2004 INIST-CNRS
CC BY 4.0
Sauf mention contraire ci-dessus, le contenu de cette notice bibliographique peut être utilisé dans le cadre d’une licence CC BY 4.0 Inist-CNRS / Unless otherwise stated above, the content of this bibliographic record may be used under a CC BY 4.0 licence by Inist-CNRS / A menos que se haya señalado antes, el contenido de este registro bibliográfico puede ser utilizado al amparo de una licencia CC BY 4.0 Inist-CNRS
CC BY 4.0
Sauf mention contraire ci-dessus, le contenu de cette notice bibliographique peut être utilisé dans le cadre d’une licence CC BY 4.0 Inist-CNRS / Unless otherwise stated above, the content of this bibliographic record may be used under a CC BY 4.0 licence by Inist-CNRS / A menos que se haya señalado antes, el contenido de este registro bibliográfico puede ser utilizado al amparo de una licencia CC BY 4.0 Inist-CNRS
Notes:
Mathematics
Accession Number:
edscal.15877487
Database:
PASCAL Archive
Further Information
The limit analysis problem (LAP) for the estimation of electric durability for a dielectric in a powerful electric field is examined. The appropriate dual problem is formulated. After the standard piecewise linear continuous finite-element approximation, the dual LAP is transformed into the problem of mathematical programming with linear limitations as equalities. This finite dimension problem is effectively solved by the standard method of gradient projection.