Treffer: Exact optimization of discrete constrained total variation minimization problems
Title:
Exact optimization of discrete constrained total variation minimization problems
Authors:
Source:
Combinatorial image analysis (Auckland, 1-3 December 2004)Lecture notes in computer science. :548-557
Publisher Information:
Berlin: Springer, 2004.
Publication Year:
2004
Physical Description:
print, 22 ref
Original Material:
INIST-CNRS
Subject Terms:
Computer science, Informatique, Mathematics, Mathématiques, Sciences exactes et technologie, Exact sciences and technology, Sciences appliquees, Applied sciences, Informatique; automatique theorique; systemes, Computer science; control theory; systems, Intelligence artificielle, Artificial intelligence, Reconnaissance des formes. Traitement numérique des images. Géométrie algorithmique, Pattern recognition. Digital image processing. Computational geometry, Analyse combinatoire, Combinatorial analysis, Análisis combinatorio, Analyse image, Image analysis, Análisis imagen, Approche probabiliste, Probabilistic approach, Enfoque probabilista, Approximation L2, L2 approximation, Aproximación L2, Courbe niveau, Contour line, Curva nivel, Discrétisation, Discretization, Discretización, Fidélité, Fidelity, Fidelidad, Minimisation, Minimization, Minimización, Modélisation, Modeling, Modelización, Optimisation sous contrainte, Constrained optimization, Optimización con restricción, Processus Markov, Markov process, Proceso Markov, Programmation discrète, Discrete programming, Programación discreta, Programmation mathématique, Mathematical programming, Programación matemática, Segmentation image, Image segmentation, Solution exacte, Exact solution, Solución exacta, Traitement image, Image processing, Procesamiento imagen, Variation totale, Total variation, Variación total
Document Type:
Konferenz
Conference Paper
File Description:
text
Language:
English
Author Affiliations:
EPITA Research and Development Laboratory (LRDE), 14-16 rue Voltaire, 94276 Le Kremlin-Bicêtre, France
ENST TSI / CNRS LTCI UMR 5141, 46 rue Barrault, 75013 Paris, France
ENST TSI / CNRS LTCI UMR 5141, 46 rue Barrault, 75013 Paris, France
ISSN:
0302-9743
Rights:
Copyright 2005 INIST-CNRS
CC BY 4.0
Sauf mention contraire ci-dessus, le contenu de cette notice bibliographique peut être utilisé dans le cadre d’une licence CC BY 4.0 Inist-CNRS / Unless otherwise stated above, the content of this bibliographic record may be used under a CC BY 4.0 licence by Inist-CNRS / A menos que se haya señalado antes, el contenido de este registro bibliográfico puede ser utilizado al amparo de una licencia CC BY 4.0 Inist-CNRS
CC BY 4.0
Sauf mention contraire ci-dessus, le contenu de cette notice bibliographique peut être utilisé dans le cadre d’une licence CC BY 4.0 Inist-CNRS / Unless otherwise stated above, the content of this bibliographic record may be used under a CC BY 4.0 licence by Inist-CNRS / A menos que se haya señalado antes, el contenido de este registro bibliográfico puede ser utilizado al amparo de una licencia CC BY 4.0 Inist-CNRS
Notes:
Computer science; theoretical automation; systems
Accession Number:
edscal.16368110
Database:
PASCAL Archive
Weitere Informationen
This paper deals with the total variation minimization problem when the fidelity is either the L2-norm or the L1-norm. We propose an algorithm which computes the exact solution of these two problems after discretization. Our method relies on the decomposition of an image into its level sets. It maps the original problems into independent binary Markov Random Field optimization problems associated with each level set. Exact solutions of these binary problems are found thanks to minimum-cut techniques. We prove that these binary solutions are increasing and thus allow to reconstruct the solution of the original problems.