Treffer: A computer program for determination of thin films thickness and optical constants

Title:
A computer program for determination of thin films thickness and optical constants
Authors:
CARICATO, A. P, FAZZI, A, LEGGIERI, G
Source:
4th International Conference on Photo-Excited Processes and Applications (4-ICPEPA)Applied surface science. 248(1-4):440-445
Publisher Information:
Amsterdam: Elsevier Science, 2005.
Publication Year:
2005
Physical Description:
print, 12 ref
Original Material:
INIST-CNRS
Subject Terms:
General chemistry, physical chemistry, Chimie générale, chimie physique, Crystallography, Cristallographie cristallogenèse, Nanotechnologies, nanostructures, nanoobjects, Nanotechnologies, nanostructures, nanoobjets, Condensed state physics, Physique de l'état condensé, Sciences exactes et technologie, Exact sciences and technology, Physique, Physics, Generalites, General, Instruments, appareillage, composants et techniques communs à plusieurs branches de la physique et de l'astronomie, Instruments, apparatus, components and techniques common to several branches of physics and astronomy, Informatique en physique expérimentale, Computers in experimental physics, Modélisation et simulation par ordinateur, Computer modeling and simulation, Etat condense: structure electronique, proprietes electriques, magnetiques et optiques, Condensed matter: electronic structure, electrical, magnetic, and optical properties, Propriétés optiques, spectroscopie et autres interactions de la matière condensée avec les particules et le rayonnement, Optical properties and condensed-matter spectroscopy and other interactions of matter with particles and radiation, Propriétés optiques des matériaux massifs et des couches minces, Optical properties of bulk materials and thin films, Constantes optiques: indice de réfraction; constante diélectrique complexe; coefficients d'absorption, de réflexion et de transmission; émissivité, Optical constants: refractive index, complex dielectric constant, absorption, reflection and transmission coefficients, emissivity, Optical constants (including refractive index, complex dielectric constant, absorption, reflection and transmission coefficients, emissivity), Code informatique, Computer codes, Couche mince, Thin films, Epaisseur, Thickness, Etat amorphe, Amorphous state, Facteur transmission, Transmittance, Factor transmisión, Film optique, Optical films, Frange interférence, Interference fringe, Franja interferencia, Hétérogénéité, Inhomogeneity, Indice extinction, Extinction index, Indice réfraction, Refractive index, Simulation ordinateur, Computerized simulation, Spectre absorption, Absorption spectra, 07.05.Tp, 78.20.-c Transmittance, 78.66.Bz, Extinction coefficient, Pulsed laser deposition
Document Type:
Konferenz Conference Paper
File Description:
text
Language:
English
Author Affiliations:
INFM, Dipartimento di Fisica, Università di Lecce, 73100 Lecce, Italy
ISSN:
0169-4332
Access URL:
http://pascal-francis.inist.fr/vibad/index.php?action=search&terms=16920458
Rights:
Copyright 2005 INIST-CNRS
CC BY 4.0
Sauf mention contraire ci-dessus, le contenu de cette notice bibliographique peut être utilisé dans le cadre d’une licence CC BY 4.0 Inist-CNRS / Unless otherwise stated above, the content of this bibliographic record may be used under a CC BY 4.0 licence by Inist-CNRS / A menos que se haya señalado antes, el contenido de este registro bibliográfico puede ser utilizado al amparo de una licencia CC BY 4.0 Inist-CNRS
Notes:
Metrology

Physics of condensed state: electronic structure, electrical, magnetic and optical properties
Accession Number:
edscal.16920458
Database:
PASCAL Archive

Weitere Informationen

A computer simulation program for processing transmission spectra of amorphous optical thin films deposited on weakly absorbing substrates and evaluation of the refractive index n, extinction coefficient k and thickness d was developed. The computer code is the implementation of an optical characterisation algorithm based on the determination of the upper and lower envelopes of the transmission spectrum interference fringes. Inhomogeneities in the thickness of the analysed films, which are responsible of a shrinking in the fringes amplitude, can be considered in the program. Relative errors in the calculated values of n, k and d have been determined using simulated transmission spectra in both cases of homogeneous and inhomogeneous films. The thickness and the refractive index of uniform films are calculated with an accuracy ≤0.5%, while the accuracy in the case including inhomogeneities is ≤2%. Simulation results for chalcogenide thin films deposited by pulsed laser deposition (PLD) on microscope slabs and glass slides are reported.