Result: Characterization of X-ray area detectors for synchrotron beamlines : Detectors

Title:
Characterization of X-ray area detectors for synchrotron beamlines : Detectors
Authors:
PONCHUT, Cyril
Source:
Journal of synchrotron radiation. 13:195-203
Publisher Information:
Oxford: Blackwell, 2006.
Publication Year:
2006
Physical Description:
print, 26 ref 2
Original Material:
INIST-CNRS
Subject Terms:
Crystallography, Cristallographie cristallogenèse, Condensed state physics, Physique de l'état condensé, Sciences exactes et technologie, Exact sciences and technology, Physique, Physics, Generalites, General, Instruments, appareillage, composants et techniques communs à plusieurs branches de la physique et de l'astronomie, Instruments, apparatus, components and techniques common to several branches of physics and astronomy, Instrumentation et techniques x et γ, X- and γ-ray instruments and techniques, Sources, miroirs, réseaux et détecteurs dans le domaine x et γ, X- and γ-ray sources, mirrors, gratings and detectors, Domaines classiques de la physique (y compris les applications), Fundamental areas of phenomenology (including applications), Optique, Optics, Formation des images et traitement optique, Imaging and optical processing, Fonctions de transfert optique et de transfert de modulation, Modulation and optical transfer functions, Détecteur rayonnement, Radiation detectors, Détection RX, X-ray detection, Fonction transfert modulation, Modulation transfer function, Función transferencia modulación, Imagerie RX, X-ray imaging, Rayon X, X radiation, Révélateur, Developers, 0785F, 4230L, DQE, MTF, NPS
Document Type:
Academic journal Article
File Description:
text
Language:
English
Author Affiliations:
European Synchrotron Radiation Facility, Grenoble, France
ISSN:
0909-0495
Access URL:
http://pascal-francis.inist.fr/vibad/index.php?action=search&terms=17590014
Rights:
Copyright 2006 INIST-CNRS
CC BY 4.0
Sauf mention contraire ci-dessus, le contenu de cette notice bibliographique peut être utilisé dans le cadre d’une licence CC BY 4.0 Inist-CNRS / Unless otherwise stated above, the content of this bibliographic record may be used under a CC BY 4.0 licence by Inist-CNRS / A menos que se haya señalado antes, el contenido de este registro bibliográfico puede ser utilizado al amparo de una licencia CC BY 4.0 Inist-CNRS
Notes:
Metrology

Physics: optics
Accession Number:
edscal.17590014
Database:
PASCAL Archive

Further Information

In order to deal with the problem of quantitative and consistent evaluation of two-dimensional X-ray detectors at synchrotron beamlines, the methodology for X-ray area detector characterization is reviewed. It is based on the definition of a minimum yet complete set of imaging parameters able to describe any kind of two-dimensional detector regardless of its operating range, field of application and detecting principle. Measuring and derivation methods are reviewed for each parameter. Imaging parameters are to a large extent directly exploitable to assess the performance of a detector for any scientific application. Imaging characterization aims at helping two-dimensional detector developers and two-dimensional detector users in defining or choosing the device best suited for a given application, based on quantitative arguments.