Treffer: Extending chi-squared statistics for key comparisons in metrology
Title:
Extending chi-squared statistics for key comparisons in metrology
Authors:
Source:
Computational and mathematical methods in science and engineering (CMMSE-2004)Journal of computational and applied mathematics. 192(1):51-58
Publisher Information:
Amsterdam: Elsevier, 2006.
Publication Year:
2006
Physical Description:
print, 11 ref
Original Material:
INIST-CNRS
Subject Terms:
Computer science, Informatique, Mathematics, Mathématiques, Sciences exactes et technologie, Exact sciences and technology, Sciences et techniques communes, Sciences and techniques of general use, Mathematiques, Mathematics, Probabilités et statistiques, Probability and statistics, Statistiques, Statistics, Lois de probabilités, Distribution theory, Analyse multivariable, Multivariate analysis, Analyse numérique. Calcul scientifique, Numerical analysis. Scientific computation, Analyse numérique, Numerical analysis, Probabilités et statistiques numériques, Numerical methods in probability and statistics, Analyse numérique, Numerical analysis, Análisis numérico, Equivalence, Equivalencia, Khi deux, Chi square, Ji cuadrado, Loi Student, Student distribution, Ley Student, Manutention, Handling, Manutención, Mathématiques appliquées, Applied mathematics, Matemáticas aplicadas, Méthode Monte Carlo, Monte Carlo method, Método Monte Carlo, Méthode statistique, Statistical method, Método estadístico, Méthode stochastique, Stochastic method, Método estocástico, Métrologie, Metrology, Metrología, Simulation, Simulación, Test hypothèse, Hypothesis test, Test hipótesis, Test statistique, Statistical test, Test estadístico, Comparaison clé, Key comparison, Valeur référence, Reference value, Null-hypothesis testing
Document Type:
Konferenz
Conference Paper
File Description:
text
Language:
English
Author Affiliations:
Institute for National Measurement Standards, National Research Council, Canada
ISSN:
0377-0427
Rights:
Copyright 2006 INIST-CNRS
CC BY 4.0
Sauf mention contraire ci-dessus, le contenu de cette notice bibliographique peut être utilisé dans le cadre d’une licence CC BY 4.0 Inist-CNRS / Unless otherwise stated above, the content of this bibliographic record may be used under a CC BY 4.0 licence by Inist-CNRS / A menos que se haya señalado antes, el contenido de este registro bibliográfico puede ser utilizado al amparo de una licencia CC BY 4.0 Inist-CNRS
CC BY 4.0
Sauf mention contraire ci-dessus, le contenu de cette notice bibliographique peut être utilisé dans le cadre d’une licence CC BY 4.0 Inist-CNRS / Unless otherwise stated above, the content of this bibliographic record may be used under a CC BY 4.0 licence by Inist-CNRS / A menos que se haya señalado antes, el contenido de este registro bibliográfico puede ser utilizado al amparo de una licencia CC BY 4.0 Inist-CNRS
Notes:
Mathematics
Accession Number:
edscal.17756191
Database:
PASCAL Archive
Weitere Informationen
We examine different Χ2 statistics appropriate for high-level metrology. Key measurement comparisons often need statistics that can be used before a reference value is chosen. One such statistic is the pair-difference Χ2, presented here. This is also a natural way to examine bilateral equivalences essential for trade. Monte Carlo simulation is a practical means to extend rigor beyond conventional Χ2 testing, and permits the use of a wide variety of reference values for familiar null-hypothesis testing. Further, simulation enables the handling of measurements purportedly drawn from Student distributions or with reported inter-laboratory covariances.