Treffer: Flux-mediated epitaxy for ferroelectric Bi4Ti3O12 single crystal film growth

Title:
Flux-mediated epitaxy for ferroelectric Bi4Ti3O12 single crystal film growth
Source:
ICE-2005 International conference on electroceramicsJournal of electroceramics. 17(2-4):189-195
Publisher Information:
Heidelberg: Springer, 2006.
Publication Year:
2006
Physical Description:
print, 15 ref
Original Material:
INIST-CNRS
Document Type:
Konferenz Conference Paper
File Description:
text
Language:
English
Author Affiliations:
Materials and Structures Laboratory, Tokyo Institute of Technology, 4259 Nagatsuda-tyo, Midori-ku, Yokohama 226-8503, Japan
National Institute of Material Science, 1-2-1 Sengen, Tsukuba, Ibaraki, 305-0047, Japan
Fuji Electric Advanced Technology Co., Ltd. 4-18-4 Tsukama, Matsumoto, Nagano 390-0821, Japan
CREST Japan Science and Technology Agency, 4-1-8 Honcho, Kawaguchi, Saitama, Japan
Department of Advanced Materials Science, School of Frontier Science, University of Tokyo, 5-1-5, Kashiwanoha, Kashiwa, Chiba 277-8568, Japan
ISSN:
1385-3449
Rights:
Copyright 2007 INIST-CNRS
CC BY 4.0
Sauf mention contraire ci-dessus, le contenu de cette notice bibliographique peut être utilisé dans le cadre d’une licence CC BY 4.0 Inist-CNRS / Unless otherwise stated above, the content of this bibliographic record may be used under a CC BY 4.0 licence by Inist-CNRS / A menos que se haya señalado antes, el contenido de este registro bibliográfico puede ser utilizado al amparo de una licencia CC BY 4.0 Inist-CNRS
Notes:
Physics and materials science
Accession Number:
edscal.18756395
Database:
PASCAL Archive

Weitere Informationen

We propose the Flux-mediated epitaxy as a novel concept for the growth of single crystalline films of incongruent, volatile, and high-temperature-melting compounds. In flux-mediated eptitaxy, by supplying materials precursors from the gas phase through the liquid flux films pre-deposited on the substrate, a quasi-thermodynamic equilibrium condition is obtained at the interface between the growing films and the flux films. This process has been demonstrated in this paper by fabricating ferroelectric Bi4Ti3O12 films, which has volatile Bi oxide. The most important step in this process is the selection of the right flux material, which is hard to predict due to the lack of an appropriate phase diagram. In order to overcome this problem, we have selected the combinatorial approach. A series of ternary flux libraries composed of two self-fluxes (Bi2O3 and Bi4Ti3O12) and a third impurity flux were fabricated on SrTiO3 (001) substrates. After that, stoichiometric Bi4Ti3O12 films were grown on each of these flux libraries at a temperature presumed to melt the flux. High-throughput characterization with the concurrent X-ray diffraction method resulted in the identification of CuO containing Bi2O3 as the flux material for the growth of single crystalline Bi4Ti3O12 films. Stoichiometric Bi4Ti3O12 films fabricated by using a novel CuO containing Bi2O3 are qualified to be single crystalline judging from their large grain size and the electrical properties equivalent to bulk single crystal's.