• March AB, a state-of-the-art m...

Treffer: March AB, a state-of-the-art march test for realistic static linked faults and dynamic faults in SRAMs

Title:
March AB, a state-of-the-art march test for realistic static linked faults and dynamic faults in SRAMs
Authors:
BOSIO, A, DI CARLO, S, DI NATALE, G, PRINETTO, P
Source:
Selected best papers from ETS'06IET computers & digital techniques (Print). 1(3):237-245
Publisher Information:
Stevenage: Institution of Engineering and Technology, 2007.
Publication Year:
2007
Physical Description:
print, 20 ref
Original Material:
INIST-CNRS
Subject Terms:
Electronics, Electronique, Computer science, Informatique, Telecommunications, Télécommunications, Sciences exactes et technologie, Exact sciences and technology, Sciences appliquees, Applied sciences, Electronique, Electronics, Electronique des semiconducteurs. Microélectronique. Optoélectronique. Dispositifs à l'état solide, Semiconductor electronics. Microelectronics. Optoelectronics. Solid state devices, Circuits intégrés, Integrated circuits, Conception. Technologies. Analyse fonctionnement. Essais, Design. Technologies. Operation analysis. Testing, Circuits intégrés par fonction (dont mémoires et processeurs), Integrated circuits by function (including memories and processors), Algorithme, Algorithm, Algoritmo, Circuit intégré, Integrated circuit, Circuito integrado, Essai statique, Static test, Ensayo estático, Etat actuel, State of the art, Estado actual, Etude comparative, Comparative study, Estudio comparativo, Mémoire accès direct statique, Static random access memory, Mémoire accès direct, Random access memory, Memoria acceso directo, Mémoire statique, Static storage, Memoria estática, Performance algorithme, Algorithm performance, Resultado algoritmo
Document Type:
Konferenz Conference Paper
File Description:
text
Language:
English
Author Affiliations:
Politecnico di Torino, Dipartimento di Automatica e Informatica, Corso Duca degli Abruzzi 24, Torino 10129, Italy
ISSN:
1751-8601
Access URL:
http://pascal-francis.inist.fr/vibad/index.php?action=search&terms=18789657
Rights:
Copyright 2007 INIST-CNRS
CC BY 4.0
Sauf mention contraire ci-dessus, le contenu de cette notice bibliographique peut être utilisé dans le cadre d’une licence CC BY 4.0 Inist-CNRS / Unless otherwise stated above, the content of this bibliographic record may be used under a CC BY 4.0 licence by Inist-CNRS / A menos que se haya señalado antes, el contenido de este registro bibliográfico puede ser utilizado al amparo de una licencia CC BY 4.0 Inist-CNRS
Notes:
Electronics
Accession Number:
edscal.18789657
Database:
PASCAL Archive

Weitere Informationen

Memory testing commonly faces two issues: the characterisation of detailed and realistic fault models, and the definition of time-efficient test algorithms able to detect them. Among the different types of algorithms proposed for testing static random access memories (SRAMs), march tests have proven to be faster, simpler and regularly structured. The continuous evolution of the memory technology requires the constant introduction of new classes of faults, such as dynamic and linked faults. Presented here is March AB, a march test targeting realistic memory static linked faults and dynamic unlinked faults. Comparison results show that the proposed march test provides the same fault coverage of already published algorithms reducing the test complexity and therefore the test time.