Treffer: Dynamic phenomena at mode-I crack front in silicon simulated by extended molecular dynamics

Title:
Dynamic phenomena at mode-I crack front in silicon simulated by extended molecular dynamics
Authors:
INAMURA, T, TAKEZAWA, N, SHIBUYA, K, YAMADA, K
Source:
57th General Assembly of CIRP, Dresden, Germany, August 19-25, 2007CIRP annals. 56(1):561-564
Publisher Information:
Oxford: Elsevier, 2007.
Publication Year:
2007
Physical Description:
print, 8 ref
Original Material:
INIST-CNRS
Subject Terms:
Mechanical engineering, Génie mécanique, Metallurgy, welding, Métallurgie, soudage, Sciences exactes et technologie, Exact sciences and technology, Physique, Physics, Domaines classiques de la physique (y compris les applications), Fundamental areas of phenomenology (including applications), Mécanique des solides, Solid mechanics, Mécanique des structures et des milieux continus, Structural and continuum mechanics, Inélasticité (thermoplasticité, viscoplasticité...), Inelasticity (thermoplasticity, viscoplasticity...), Vibration, onde mécanique, stabilité dynamique (aéroélasticité, contrôle vibration...), Vibration, mechanical wave, dynamic stability (aeroelasticity, vibration control...), Mécanique de la rupture (fissure, fatigue, endommagement...), Fracture mechanics (crack, fatigue, damage...), Cavité, Cavity, Cavidad, Dynamique moléculaire, Molecular dynamics, Dinámica molecular, Elastodynamique, Elastodynamics, Elastodinámico, Elastoplasticité, Elastoplasticity, Elastoplasticidad, Fissure, Crack, Fisura, Front onde, Wavefront, Frente onda, Inélasticité, Inelasticity, Inelasticidad, Monocristal, Single crystal, Onde Rayleigh, Rayleigh wave, Onda Rayleigh, Onde élastique, Elastic wave, Onda elástica, Rugosité, Roughness, Rugosidad, Rupture ductile, Ductile fracture, Ruptura dúctil, Rupture fragile, Brittle fracture, Ruptura frágil, Silicium, Silicon, Silicio, Surface lisse, Smooth surface, Superficie lisa, Surface rugueuse, Rough surface, Superficie rugosa, Surface rupture, Fracture surface, Superficie ruptura, Système glissement, Slip system, Sistema deslizamiento, Microdynamics, Simulation
Document Type:
Konferenz Conference Paper
File Description:
text
Language:
English
Author Affiliations:
Nagoya Institute of Technology, Gokiso-cho, Showa-ku, Nagoya 466-8555, Japan
ISSN:
0007-8506
Access URL:
http://pascal-francis.inist.fr/vibad/index.php?action=search&terms=18979328
Rights:
Copyright 2007 INIST-CNRS
CC BY 4.0
Sauf mention contraire ci-dessus, le contenu de cette notice bibliographique peut être utilisé dans le cadre d’une licence CC BY 4.0 Inist-CNRS / Unless otherwise stated above, the content of this bibliographic record may be used under a CC BY 4.0 licence by Inist-CNRS / A menos que se haya señalado antes, el contenido de este registro bibliográfico puede ser utilizado al amparo de una licencia CC BY 4.0 Inist-CNRS
Notes:
Physics: solid mechanics
Accession Number:
edscal.18979328
Database:
PASCAL Archive

Weitere Informationen

Analytical-solution-controlled molecular dynamics that can simulate atomic-scale phenomena around a crack front has been extended so that it can also simulate phenomena caused dynamically by elastic/plastic waves. The result of the simulation for monocrystalline silicon shows that a quasi-statically opening crack creates voids around the crack front and leaves dimples on the fractured surfaces as in cases of ductile fracture. On the other hand, elastic/plastic waves emitted from around the crack front change the above phenomena such that various surfaces, from smooth to very rough ones, result. A smooth surface is created by a Rayleigh wave that travels along fractured surfaces, creating new surfaces at its wavefront, while a rough surface is made by a chain mechanism wherein a void is created by wave-driven cross slip and this void, in turn, emits new waves which cause voids.