Result: On Confidence Intervals for Process Capability Indices in a One-Way Random Model
Title:
On Confidence Intervals for Process Capability Indices in a One-Way Random Model
Authors:
Source:
Communications in statistics. Simulation and computation. 41(8-10):1805-1815
Publisher Information:
Colchester: Taylor & Francis, 2012.
Publication Year:
2012
Physical Description:
print, 3/4 p
Original Material:
INIST-CNRS
Subject Terms:
Mathematics, Mathématiques, Sciences exactes et technologie, Exact sciences and technology, Sciences et techniques communes, Sciences and techniques of general use, Mathematiques, Mathematics, Probabilités et statistiques, Probability and statistics, Statistiques, Statistics, Inférence paramétrique, Parametric inference, Inférence non paramétrique, Nonparametric inference, Analyse numérique. Calcul scientifique, Numerical analysis. Scientific computation, Analyse numérique, Numerical analysis, Probabilités et statistiques numériques, Numerical methods in probability and statistics, Ajustement modèle, Model matching, Ajustamiento modelo, Approximation, Aproximación, Bootstrap, Effet aléatoire, Random effect, Efecto aleatorio, Estimation non paramétrique, Non parametric estimation, Estimación no paramétrica, Estimation statistique, Statistical estimation, Estimación estadística, Intervalle confiance, Confidence interval, Intervalo confianza, Limite confiance, Confidence limit, Límite confianza, Méthode jackknife, Jackknife method, Método jackknife, Méthode rééchantillonnage, Resampling method, Méthode statistique, Statistical method, Método estadístico, Simulation numérique, Numerical simulation, Simulación numérica, Simulation statistique, Statistical simulation, Simulación estadística, 62F25, 62F40, 62G05, 62G15, Estimation paramétrique, Probabilité couverture, Coverage probability, Bissell's formula, Bootstrap calibration, Generalized confidence interval, One-way random effect model, Primary 62P30, Process capability index, Satterthwaite's method, Secondary 62F25, 62F40
Document Type:
Academic journal
Article
File Description:
text
Language:
English
Author Affiliations:
Department of Statistics, St. Thomas College, Kerala, India
Department of Statistics, Newman College, Kerala, India
Department of Statistics, Newman College, Kerala, India
ISSN:
0361-0918
Rights:
Copyright 2015 INIST-CNRS
CC BY 4.0
Sauf mention contraire ci-dessus, le contenu de cette notice bibliographique peut être utilisé dans le cadre d’une licence CC BY 4.0 Inist-CNRS / Unless otherwise stated above, the content of this bibliographic record may be used under a CC BY 4.0 licence by Inist-CNRS / A menos que se haya señalado antes, el contenido de este registro bibliográfico puede ser utilizado al amparo de una licencia CC BY 4.0 Inist-CNRS
CC BY 4.0
Sauf mention contraire ci-dessus, le contenu de cette notice bibliographique peut être utilisé dans le cadre d’une licence CC BY 4.0 Inist-CNRS / Unless otherwise stated above, the content of this bibliographic record may be used under a CC BY 4.0 licence by Inist-CNRS / A menos que se haya señalado antes, el contenido de este registro bibliográfico puede ser utilizado al amparo de una licencia CC BY 4.0 Inist-CNRS
Notes:
Mathematics
Accession Number:
edscal.26164024
Database:
PASCAL Archive
Further Information
In this article, we investigated the bootstrap calibrated generalized confidence limits for process capability indices Cpk for the one-way random effect model. Also, we derived Bissell's approximation formula for the lower confidence limit using Satterthwaite's method and calculated its coverage probabilities and expected values. Then we compared it with standard bootstrap (SB) method and generalized confidence interval method. The simulation results indicate that the confidence limit obtained offers satisfactory coverage probabilities. The proposed method is illustrated with the help of simulation studies and data sets.