HUNLETH, F., & CYTRON, R. K. (2002, January 1). Footprint and feature management using aspect-oriented programming techniques. 37(7). Broadway, NY: ACM, 2002. Retrieved from http://pascal-francis.inist.fr/vibad ndex.php?action=search&terms=13855745
ISO-690 (author-date, English)HUNLETH, Frank and CYTRON, Ron K, 2002. Footprint and feature management using aspect-oriented programming techniques. In: [online]. Broadway, NY: ACM, 2002. 1 January 2002. Available from: http://pascal-francis.inist.fr/vibad ndex.php?action=search&terms=13855745
Modern Language Association 9th editionHUNLETH, F., and R. K. CYTRON. Footprint and feature management using aspect-oriented programming techniques. no. 7, Broadway, NY: ACM, 2002., 2002, http://pascal-francis.inist.fr/vibad ndex.php?action=search&terms=13855745.
Mohr Siebeck - Recht (Deutsch - Österreich)Emerald - Harvard
HUNLETH, F. and CYTRON, R.K. (2002), “Footprint and feature management using aspect-oriented programming techniques”, in , Vol. 37, Broadway, NY: ACM, 2002., available at: http://pascal-francis.inist.fr/vibad ndex.php?action=search&terms=13855745.