MOUHOUBI, S., YAO, T., LALANDE, F., & CANET, P. (2007, January 1). Thermal behavior of floating gate oxide defects (moving bits). 353(5-7). Amsterdam: Elsevier, 2007. Retrieved from http://pascal-francis.inist.fr/vibad ndex.php?action=search&terms=18642606
ISO-690 (author-date, English)MOUHOUBI, S, YAO, T, LALANDE, F and CANET, P, 2007. Thermal behavior of floating gate oxide defects (moving bits). In: [online]. Amsterdam: Elsevier, 2007. 1 January 2007. Available from: http://pascal-francis.inist.fr/vibad ndex.php?action=search&terms=18642606
Modern Language Association 9th editionMOUHOUBI, S., T. YAO, F. LALANDE, and P. CANET. Thermal behavior of floating gate oxide defects (moving bits). no. 5-7, Amsterdam: Elsevier, 2007., 2007, http://pascal-francis.inist.fr/vibad ndex.php?action=search&terms=18642606.
Mohr Siebeck - Recht (Deutsch - Österreich)Emerald - Harvard
MOUHOUBI, S., YAO, T., LALANDE, F. and CANET, P. (2007), “Thermal behavior of floating gate oxide defects (moving bits)”, in , Vol. 353, Amsterdam: Elsevier, 2007., available at: http://pascal-francis.inist.fr/vibad ndex.php?action=search&terms=18642606.