In-situ measurement of supply-noise maps with millivolt accuracy and nanosecond-order time resolution - KANNO, Yusuke; KONDOH, Yuki; IRITA, Takahiro; HIROSE, Kenji; MORI, Ryo; YASU, Yoshihiko; KOMATSU, Shigenobu; MIZUNO, Hiroyuki (2006 Symposium on VLSI circuits, 2007)
text