ARGUNOVA, T. S., YI, J. M., JUNG, J. W., JE, J. H., SOROKIN, L. M., GUTKIN, M. Y., BELYAKOVA, E. I., KOSTINA, L. S., ZABRODSKII, A. G., & ABROSIMOV, N. V. (2007, January 1). White X-ray beam topography and radiography of Si1-x Gex crystals bonded to silicon. 204(8). Berlin: Wiley-VCH, 2007. Retrieved from http://pascal-francis.inist.fr/vibad ndex.php?action=search&terms=19018858
ISO-690 (author-date, English)ARGUNOVA, T. S, YI, J. M, JUNG, J. W, JE, J. H, SOROKIN, L. M, GUTKIN, M. Yu, BELYAKOVA, E. I, KOSTINA, L. S, ZABRODSKII, A. G and ABROSIMOV, N. V, 2007. White X-ray beam topography and radiography of Si1-x Gex crystals bonded to silicon. In: [online]. Berlin: Wiley-VCH, 2007. 1 January 2007. Available from: http://pascal-francis.inist.fr/vibad ndex.php?action=search&terms=19018858
Modern Language Association 9th editionARGUNOVA, T. S., J. M. YI, J. W. JUNG, J. H. JE, L. M. SOROKIN, M. Y. GUTKIN, E. I. BELYAKOVA, L. S. KOSTINA, A. G. ZABRODSKII, and N. V. ABROSIMOV. White X-ray beam topography and radiography of Si1-x Gex crystals bonded to silicon. no. 8, Berlin: Wiley-VCH, 2007., 2007, http://pascal-francis.inist.fr/vibad ndex.php?action=search&terms=19018858.
Mohr Siebeck - Recht (Deutsch - Österreich)Emerald - Harvard
ARGUNOVA, T.S., YI, J.M., JUNG, J.W., JE, J.H., SOROKIN, L.M., GUTKIN, M.Y., BELYAKOVA, E.I., KOSTINA, L.S., ZABRODSKII, A.G. and ABROSIMOV, N.V. (2007), “White X-ray beam topography and radiography of Si1-x Gex crystals bonded to silicon”, in , Vol. 204, Berlin: Wiley-VCH, 2007., available at: http://pascal-francis.inist.fr/vibad ndex.php?action=search&terms=19018858.