Watermarking for 3D CAD drawings based on three components - KWON, Ki-Ryong; LEE, Suk-Hwan; LEE, Eung-Joo; KWON, Seong-Geun (Structural, syntactic, and statistical pattern recognition (joint IAPR international workshops, SSPR 2006 and SPR 2006, Hong Kong, China, August 17-19, 2006), 2006)
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