Treffer: Long working distance portable smartphone microscopy for metallic mesh defect detection

Title:
Long working distance portable smartphone microscopy for metallic mesh defect detection
Alternate Title:
基于长工作距便携式智能手机显微镜的金属网栅缺陷检测技术
Authors:
Aff1, Aff2, IDFITEE2401002_cor1, Aff1, Aff2, Aff1, Aff2, Aff3, Aff1, Aff2
Source:
Frontiers of Information Technology & Electronic Engineering. 26(7):1131-1143
Database:
Springer Nature Journals