American Psychological Association 6th edition

Hu, Y., Zhu, M., & Lin, H. (2025). A nonlinear wiener process degradation model with damage resistance for reliability analysis. Annals of Operations Research, 1-24. https://doi.org/10.1007/s10479-025-06695-5

ISO-690 (author-date, English)

HU, Yuhan, ZHU, Mengmeng und LIN, Huizhong, 2025. A nonlinear wiener process degradation model with damage resistance for reliability analysis. Annals of Operations Research. 14 Juli 2025. P. 1-24. DOI 10.1007/s10479-025-06695-5.

Modern Language Association 9th edition

Hu, Y., M. Zhu, und H. Lin. „A Nonlinear Wiener Process Degradation Model With Damage Resistance for Reliability Analysis“. Annals of Operations Research, Juli 2025, S. 1-24, https://doi.org/10.1007/s10479-025-06695-5.

Mohr Siebeck - Recht (Deutsch - Österreich)

Hu, Yuhan/Zhu, Mengmeng/Lin, Huizhong: A nonlinear wiener process degradation model with damage resistance for reliability analysis, Annals of Operations Research 2025, 1-24.

Emerald - Harvard

Hu, Y., Zhu, M. und Lin, H. (2025), „A nonlinear wiener process degradation model with damage resistance for reliability analysis“, Annals of Operations Research, S. 1-24.

Achtung: Diese Zitate sind unter Umständen nicht zu 100% korrekt.