Gao, L., Zheng, F., & Bian, J. Y. (2022). Using computer theory to detect PCB defects in an Io T environment. The Journal of Supercomputing: An International Journal of High-Performance Computer Design, Analysis, and Use, 78(17), 18887-18914. https://doi.org/10.1007/s11227-022-04610-4
ISO-690 (author-date, English)GAO, Long, ZHENG, Fen und BIAN, Jian Yong, 2022. Using computer theory to detect PCB defects in an Io T environment. The Journal of Supercomputing: An International Journal of High-Performance Computer Design, Analysis, and Use. 1 November 2022. Vol. 78, no. 17, p. 18887-18914. DOI 10.1007/s11227-022-04610-4.
Modern Language Association 9th editionGao, L., F. Zheng, und J. Y. Bian. „Using Computer Theory to Detect PCB Defects in an Io T Environment“. The Journal of Supercomputing: An International Journal of High-Performance Computer Design, Analysis, and Use, Bd. 78, Nr. 17, November 2022, S. 18887-14, https://doi.org/10.1007/s11227-022-04610-4.
Mohr Siebeck - Recht (Deutsch - Österreich)Gao, Long/Zheng, Fen/Bian, Jian Yong: Using computer theory to detect PCB defects in an Io T environment, The Journal of Supercomputing: An International Journal of High-Performance Computer Design, Analysis, and Use 2022, 18887-18914.
Emerald - HarvardGao, L., Zheng, F. und Bian, J.Y. (2022), „Using computer theory to detect PCB defects in an Io T environment“, The Journal of Supercomputing: An International Journal of High-Performance Computer Design, Analysis, and Use, Vol. 78 No. 17, S. 18887-18914.