American Psychological Association 6th edition

He, D., Wang, Y., Wu, J., Jin, Z., Zhao, M., & Chen, Y. (2025). Degradation state prediction of IGBT based on optimized variational mode decomposition and hybrid models. Electrical Engineering: Archiv für Elektrotechnik, 107(9), 11847-11867. https://doi.org/10.1007/s00202-025-03126-3

ISO-690 (author-date, English)

HE, Deqiang, WANG, Yanbo, WU, Jinxin, JIN, Zhenzhen, ZHAO, Ming and CHEN, Yanjun, 2025. Degradation state prediction of IGBT based on optimized variational mode decomposition and hybrid models. Electrical Engineering: Archiv für Elektrotechnik. 1 September 2025. Vol. 107, no. 9, p. 11847-11867. DOI 10.1007/s00202-025-03126-3.

Modern Language Association 9th edition

He, D., Y. Wang, J. Wu, Z. Jin, M. Zhao, and Y. Chen. “Degradation State Prediction of IGBT Based on Optimized Variational Mode Decomposition and Hybrid Models”. Electrical Engineering: Archiv für Elektrotechnik, vol. 107, no. 9, Sept. 2025, pp. 11847-6, https://doi.org/10.1007/s00202-025-03126-3.

Mohr Siebeck - Recht (Deutsch - Österreich)

He, Deqiang/Wang, Yanbo/Wu, Jinxin/Jin, Zhenzhen/Zhao, Ming/Chen, Yanjun: Degradation state prediction of IGBT based on optimized variational mode decomposition and hybrid models, Electrical Engineering: Archiv für Elektrotechnik 2025, 11847-11867.

Emerald - Harvard

He, D., Wang, Y., Wu, J., Jin, Z., Zhao, M. and Chen, Y. (2025), “Degradation state prediction of IGBT based on optimized variational mode decomposition and hybrid models”, Electrical Engineering: Archiv für Elektrotechnik, Vol. 107 No. 9, pp. 11847-11867.

Warning: These citations may not always be 100% accurate.