Serviceeinschränkungen vom 12.-22.02.2026 - weitere Infos auf der UB-Homepage
American Psychological Association 6th edition

Foster, A., & Hofer, W. [ca. 2006]. Scanning Probe Microscopy : Atomic Scale Engineering by Forces and Currents. In Nano Science and Technology [Cd]. New York, NY: Springer New York. https://doi.org/10.1007/0-387-37231-8

ISO-690 (author-date, English)

FOSTER, Adam und HOFER, Werner, 2006. Scanning Probe Microscopy : Atomic Scale Engineering by Forces and Currents. New York, NY: Springer New York. ISBN 9780387372310.

Modern Language Association 9th edition

Foster, A., und W. Hofer. „Scanning Probe Microscopy : Atomic Scale Engineering by Forces and Currents“. Nano Science and Technology, cd, Springer New York, 2006, https://doi.org/10.1007/0-387-37231-8.

Mohr Siebeck - Recht (Deutsch - Österreich)

Foster, Adam/Hofer, Werner: Scanning Probe Microscopy : Atomic Scale Engineering by Forces and Currents, New York, NY 2006.

Emerald - Harvard

Foster, A. und Hofer, W. (2006), Scanning Probe Microscopy : Atomic Scale Engineering by Forces and Currents, Nano Science and Technology, Bd. , Springer New York, New York, NY, verfügbar unter:https://doi.org/10.1007/0-387-37231-8.

Achtung: Diese Zitate sind unter Umständen nicht zu 100% korrekt.