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American Psychological Association 6th edition

Moyne, J. R., & Patel, N. S. (2007). Special Section on Advanced Process Control. IEEE Transactions on Semiconductor Manufacturing, 20(4), 343-344. https://doi.org/10.1109/TSM.2007.907606

ISO-690 (author-date, English)

MOYNE, James R. und PATEL, Nital S., 2007. Special Section on Advanced Process Control. IEEE Transactions on Semiconductor Manufacturing. 1 November 2007. Vol. 20, no. 4, p. 343-344. DOI 10.1109/TSM.2007.907606.

Modern Language Association 9th edition

Moyne, J. R., und N. S. Patel. „Special Section on Advanced Process Control.“. IEEE Transactions on Semiconductor Manufacturing, Bd. 20, Nr. 4, November 2007, S. 343-4, https://doi.org/10.1109/TSM.2007.907606.

Mohr Siebeck - Recht (Deutsch - Österreich)

Moyne, James R./Patel, Nital S.: Special Section on Advanced Process Control., IEEE Transactions on Semiconductor Manufacturing 2007, 343-344.

Emerald - Harvard

Moyne, J.R. und Patel, N.S. (2007), „Special Section on Advanced Process Control.“, IEEE Transactions on Semiconductor Manufacturing, Vol. 20 No. 4, S. 343-344.

Achtung: Diese Zitate sind unter Umständen nicht zu 100% korrekt.