Treffer: Classification Algorithm for VLSI Test Cost Reduction
Title:
Classification Algorithm for VLSI Test Cost Reduction
Authors:
Source:
2024 28th International Symposium on VLSI Design and Test (VDAT). :1-5
Publisher Information:
IEEE, 2024.
Publication Year:
2024
Document Type:
Fachzeitschrift
Article
DOI:
10.1109/vdat63601.2024.10705694
Rights:
STM Policy #29
Accession Number:
edsair.doi...........a32bd4c20ccd4780f7767bb49964dfbd
Database:
OpenAIRE