American Psychological Association 6th edition

Farook Basha Shaik, & Manish Kashyap. (2024). Classification Algorithm for VLSI Test Cost Reduction. 2024 28 th International Symposium on VLSI Design and Test (VDAT), 1-5. https://doi.org/10.1109/vdat63601.2024.10705694

ISO-690 (author-date, English)

FAROOK BASHA SHAIK and MANISH KASHYAP, 2024. Classification Algorithm for VLSI Test Cost Reduction. 2024 28 th International Symposium on VLSI Design and Test (VDAT). 1 September 2024. P. 1-5. DOI 10.1109/vdat63601.2024.10705694.

Modern Language Association 9th edition

Farook Basha Shaik, and Manish Kashyap. “Classification Algorithm for VLSI Test Cost Reduction”. 2024 28 th International Symposium on VLSI Design and Test (VDAT), Sept. 2024, pp. 1-5, https://doi.org/10.1109/vdat63601.2024.10705694.

Mohr Siebeck - Recht (Deutsch - Österreich)

Farook Basha Shaik/Manish Kashyap: Classification Algorithm for VLSI Test Cost Reduction, 2024 28 th International Symposium on VLSI Design and Test (VDAT) 2024, 1-5.

Emerald - Harvard

Farook Basha Shaik and Manish Kashyap. (2024), “Classification Algorithm for VLSI Test Cost Reduction”, 2024 28 th International Symposium on VLSI Design and Test (VDAT), pp. 1-5.

Warning: These citations may not always be 100% accurate.