Result: XML-based data management system for combinatorial solid-state materials science

Title:
XML-based data management system for combinatorial solid-state materials science
Authors:
MEGURO, S, LIPPMAA, M, OHNISHI, T, CHIKYOW, T, KOINUMA, H
Source:
CMST-3: proceedings of the third Japan-US workshop on combinatorial material science and technology, Okinawa, Japan, 7-10 December, 2004Applied surface science. 252(7):2634-2639
Publisher Information:
Amsterdam: Elsevier Science, 2006.
Publication Year:
2006
Physical Description:
print, 6 ref
Original Material:
INIST-CNRS
Subject Terms:
General chemistry, physical chemistry, Chimie générale, chimie physique, Crystallography, Cristallographie cristallogenèse, Nanotechnologies, nanostructures, nanoobjects, Nanotechnologies, nanostructures, nanoobjets, Condensed state physics, Physique de l'état condensé, Sciences exactes et technologie, Exact sciences and technology, Physique, Physics, Generalites, General, Instruments, appareillage, composants et techniques communs à plusieurs branches de la physique et de l'astronomie, Instruments, apparatus, components and techniques common to several branches of physics and astronomy, Informatique en physique expérimentale, Computers in experimental physics, Couche mince, Thin films, Langage XML, XML language, Lenguaje XML, Méthode combinatoire, Combinatorial method, Método combinatorio, Data management system, Materials informatics, XML Schema
Document Type:
Conference Conference Paper
File Description:
text
Language:
English
Author Affiliations:
National Institute for Materials Science (NIMS), Tsukuba 305-0044, Japan
Institute for Solid State Physics, University of Tokyo, Kashiwa 277-8581, Japan
Combinatorial Materials Exploration and Technology (COMET), NIMS, Tsukuba 305-0044, Japan
Materials and Structures Laboratory, Tokyo Institute of Technology, Yokohama 226-8503, Japan
ISSN:
0169-4332
Access URL:
http://pascal-francis.inist.fr/vibad/index.php?action=search&terms=17567824
Rights:
Copyright 2006 INIST-CNRS
CC BY 4.0
Sauf mention contraire ci-dessus, le contenu de cette notice bibliographique peut être utilisé dans le cadre d’une licence CC BY 4.0 Inist-CNRS / Unless otherwise stated above, the content of this bibliographic record may be used under a CC BY 4.0 licence by Inist-CNRS / A menos que se haya señalado antes, el contenido de este registro bibliográfico puede ser utilizado al amparo de una licencia CC BY 4.0 Inist-CNRS
Notes:
Metrology
Accession Number:
edscal.17567824
Database:
PASCAL Archive

Further Information

Informatics tools are an important part of the high-throughput or combinatorial materials development process. Particularly for thin film studies, the rate of sample synthesis and characterization has increased to a point where the throughput of the whole materials development process is limited by the ability to process the characterization data and design new experiments. We describe in this work software tools that we have developed to solve the data management problems. In particular, we discuss the use of extensible markup language (XML) to address the problem of representing structurally varied experimental data in a data management system without having to make modifications to the core software parts whenever the materials processing or characterization tools or sample and data handling procedures change.