Result: In-situ measurement of supply-noise maps with millivolt accuracy and nanosecond-order time resolution
Title:
In-situ measurement of supply-noise maps with millivolt accuracy and nanosecond-order time resolution
Authors:
Source:
2006 Symposium on VLSI circuitsIEEE journal of solid-state circuits. 42(4):784-789
Publisher Information:
New York, NY: Institute of Electrical and Electronics Engineers, 2007.
Publication Year:
2007
Physical Description:
print, 8 ref
Original Material:
INIST-CNRS
Subject Terms:
Electronics, Electronique, Sciences exactes et technologie, Exact sciences and technology, Sciences appliquees, Applied sciences, Electronique, Electronics, Appareillage électronique et fabrication. Composants passifs, circuits imprimés, connectique, Electronic equipment and fabrication. Passive components, printed wiring boards, connectics, Electronique des semiconducteurs. Microélectronique. Optoélectronique. Dispositifs à l'état solide, Semiconductor electronics. Microelectronics. Optoelectronics. Solid state devices, Circuits intégrés, Integrated circuits, Conception. Technologies. Analyse fonctionnement. Essais, Design. Technologies. Operation analysis. Testing, Circuits intégrés par fonction (dont mémoires et processeurs), Integrated circuits by function (including memories and processors), Circuits électriques, optiques et optoélectroniques, Electric, optical and optoelectronic circuits, Propriétés des circuits, Circuit properties, Circuits électroniques, Electronic circuits, Oscillateurs, résonateurs, synthétiseurs, Oscillators, resonators, synthetizers, Alimentation électrique, Power supply, Alimentación eléctrica, Circuit LSI, LSI circuit, Circuito LSI, Circuit intégré, Integrated circuit, Circuito integrado, Domaine temps ns, ns range, Echantillonnage, Sampling, Muestreo, Electronique puissance, Power electronics, Electrónica potencia, Fréquence oscillation, Oscillation frequency, Frecuencia oscilación, In situ, Mesure bruit, Noise measurement, Oscillateur anneau, Ring oscillator, Oscilador anillo, Oscillateur local, Local oscillator, Oscilador local, Processeur signal numérique, Digital signal processor, Procesador señal numérica, Précision mesure, Measurement accuracy, Precisión medida, Radiocommunication service mobile, Mobile radiocommunication, Radiocomunicación servicio móvil, Résolution temporelle, Time resolution, Resolución temporal, Système sur puce, System on a chip, Sistema sobre pastilla, Téléphone portable, Mobile phone, Teléfono móvil, In situ measurement, power integrity, power- supply-noise map, ring oscillator, system-on-chip (SoC)
Document Type:
Conference
Conference Paper
File Description:
text
Language:
English
Author Affiliations:
Central Research Laboratory, Hitachi, Ltd, Tokyo 185-8601, Japan
Renesas Technology Cor poration, Tokyo 187-8588, Japan
Strategy Center, R&D Group, Hitachi, Ltd, Tokyo 100-8220, Japan
Renesas Technology Cor poration, Tokyo 187-8588, Japan
Strategy Center, R&D Group, Hitachi, Ltd, Tokyo 100-8220, Japan
ISSN:
0018-9200
Rights:
Copyright 2007 INIST-CNRS
CC BY 4.0
Sauf mention contraire ci-dessus, le contenu de cette notice bibliographique peut être utilisé dans le cadre d’une licence CC BY 4.0 Inist-CNRS / Unless otherwise stated above, the content of this bibliographic record may be used under a CC BY 4.0 licence by Inist-CNRS / A menos que se haya señalado antes, el contenido de este registro bibliográfico puede ser utilizado al amparo de una licencia CC BY 4.0 Inist-CNRS
CC BY 4.0
Sauf mention contraire ci-dessus, le contenu de cette notice bibliographique peut être utilisé dans le cadre d’une licence CC BY 4.0 Inist-CNRS / Unless otherwise stated above, the content of this bibliographic record may be used under a CC BY 4.0 licence by Inist-CNRS / A menos que se haya señalado antes, el contenido de este registro bibliográfico puede ser utilizado al amparo de una licencia CC BY 4.0 Inist-CNRS
Notes:
Electronics
Accession Number:
edscal.18665976
Database:
PASCAL Archive
Further Information
An in situ measurement scheme for generating supply-noise maps, which can be conducted while running applications in product-level LSIs, was developed. The design of the on-chip voltage sampling probe is based on a simple ring oscillator, which converts local supply difference between VDD and VSS to oscillation-frequency deviation. High measurement accuracy is achieved by off-chip digital signal processing and calibration. This scheme was used to successfully measure 69-mV local supply noise with 5-ns time resolution in a 3G-cellular-phone processor. It will thus help in designing power-supply networks and in visually verifying the quality of a power supply.