Result: Transient voltage overshoot in TLP testing : Real or artifact?
Title:
Transient voltage overshoot in TLP testing : Real or artifact?
Authors:
Source:
Microelectronics and reliability. 47(7):1016-1024
Publisher Information:
Oxford: Elsevier, 2007.
Publication Year:
2007
Physical Description:
print, 6 ref
Original Material:
INIST-CNRS
Subject Terms:
Electronics, Electronique, Sciences exactes et technologie, Exact sciences and technology, Sciences appliquees, Applied sciences, Electronique, Electronics, Electronique des semiconducteurs. Microélectronique. Optoélectronique. Dispositifs à l'état solide, Semiconductor electronics. Microelectronics. Optoelectronics. Solid state devices, Circuits intégrés, Integrated circuits, Conception. Technologies. Analyse fonctionnement. Essais, Design. Technologies. Operation analysis. Testing, Analyse donnée, Data analysis, Análisis datos, Circuit intégré, Integrated circuit, Circuito integrado, Décharge électrostatique, Electrostatic discharge, Essai circuit intégré, Integrated circuit testing, Fiabilité, Reliability, Fiabilidad, Méthode numérique, Numerical method, Método numérico, Réponse impulsion, Pulse response, Respuesta impulsión, Réponse transitoire, Transient response, Respuesta transitoria
Document Type:
Conference
Conference Paper
File Description:
text
Language:
English
Author Affiliations:
IMEC vzw, 75 Kapeldreef, Leuven 3001, Belgium
Electrical Engineering Department, Katholieke Universiteit, Leuven 3001, Belgium
Electrical Engineering Department, Katholieke Universiteit, Leuven 3001, Belgium
ISSN:
0026-2714
Rights:
Copyright 2007 INIST-CNRS
CC BY 4.0
Sauf mention contraire ci-dessus, le contenu de cette notice bibliographique peut être utilisé dans le cadre d’une licence CC BY 4.0 Inist-CNRS / Unless otherwise stated above, the content of this bibliographic record may be used under a CC BY 4.0 licence by Inist-CNRS / A menos que se haya señalado antes, el contenido de este registro bibliográfico puede ser utilizado al amparo de una licencia CC BY 4.0 Inist-CNRS
CC BY 4.0
Sauf mention contraire ci-dessus, le contenu de cette notice bibliographique peut être utilisé dans le cadre d’une licence CC BY 4.0 Inist-CNRS / Unless otherwise stated above, the content of this bibliographic record may be used under a CC BY 4.0 licence by Inist-CNRS / A menos que se haya señalado antes, el contenido de este registro bibliográfico puede ser utilizado al amparo de una licencia CC BY 4.0 Inist-CNRS
Notes:
Electronics
Accession Number:
edscal.18835137
Database:
PASCAL Archive
Further Information
This paper investigates on the transient pulse response of the device under test, which is becoming a critical aspect in determining the ESD reliability of a variety of technology products. For the first time, the feasibility to calibrate or tune the artifacts arising out of system parasitic to 'see' the device transient response is presented in this paper with experimental data and numerical analysis.