Result: Test results on 500 kVA-class MgB2-based fault current limiter prototypes
Title:
Test results on 500 kVA-class MgB2-based fault current limiter prototypes
Source:
The 2006 applied superconductivity conference, Seattle, WA, August 27-September 1, 2006. Part II of three partsIEEE transactions on applied superconductivity. 17(2):1776-1779
Publisher Information:
New York, NY: Institute of Electrical and Electronics Engineers, 2007.
Publication Year:
2007
Physical Description:
print, 6 ref 2
Original Material:
INIST-CNRS
Subject Terms:
Electronics, Electronique, Electrical engineering, Electrotechnique, Sciences exactes et technologie, Exact sciences and technology, Sciences appliquees, Applied sciences, Electronique, Electronics, Essais, mesure, bruit et fiabilité, Testing, measurement, noise and reliability, Electronique des semiconducteurs. Microélectronique. Optoélectronique. Dispositifs à l'état solide, Semiconductor electronics. Microelectronics. Optoelectronics. Solid state devices, Dispositifs supraconducteurs, Superconducting devices, Electrotechnique. Electroenergetique, Electrical engineering. Electrical power engineering, Matériaux, Materials, Appareillage de connexion et de protection, Connection and protection apparatus, Bande supraconductrice, Superconducting tapes, Circuit intégré, Integrated circuit, Circuito integrado, Comportement thermique, Thermal behavior, Comportamiento térmico, Courant court circuit, Short circuit currents, Courant défaut, Fault currents, Court circuit, Short circuit, Cortocircuito, Dispositif protection, Protective device, Dispositivo protección, Dispositif supraconducteur, Superconductor device, Dispositivo supraconductor, Essai circuit, Circuit testing, Essai électrique, Electrical test, Ensayo eléctrico, Interconnexion, Interconnection, Interconexión, Isolation électrique, Electrical insulation, Aislamiento eléctrico, Limiteur courant défaut, Fault current limiters, Perte watts, Hysteresis loss, Pérdida por hístéresis, Prototype, Prototipo, Prévention dommage, Damage prevention, Prevención daño, Supraconducteur haute température, High temperature superconductor, Supraconductor alta temperatura, Température cryogénique, Cryogenic temperature, Temperatura criogénica, Traitement surface, Surface treatment, Tratamiento superficie, Hysteretic loss, MgB2, Ni-alloy, short-circuit current, superconducting fault current limiter (SFCL)
Document Type:
Conference
Conference Paper
File Description:
text
Language:
English
Author Affiliations:
CESI Ricerca SpA, Via Rubattino 54, 20134 Milan, Italy
ISSN:
1051-8223
Rights:
Copyright 2007 INIST-CNRS
CC BY 4.0
Sauf mention contraire ci-dessus, le contenu de cette notice bibliographique peut être utilisé dans le cadre d’une licence CC BY 4.0 Inist-CNRS / Unless otherwise stated above, the content of this bibliographic record may be used under a CC BY 4.0 licence by Inist-CNRS / A menos que se haya señalado antes, el contenido de este registro bibliográfico puede ser utilizado al amparo de una licencia CC BY 4.0 Inist-CNRS
CC BY 4.0
Sauf mention contraire ci-dessus, le contenu de cette notice bibliographique peut être utilisé dans le cadre d’une licence CC BY 4.0 Inist-CNRS / Unless otherwise stated above, the content of this bibliographic record may be used under a CC BY 4.0 licence by Inist-CNRS / A menos que se haya señalado antes, el contenido de este registro bibliográfico puede ser utilizado al amparo de una licencia CC BY 4.0 Inist-CNRS
Notes:
Electrical engineering. Electroenergetics
Electronics
Electronics
Accession Number:
edscal.19016605
Database:
PASCAL Archive
Further Information
The growth in generation and the increased interconnection of electrical grids lead to higher fault currents and therefore there is a considerable interest in Fault Current Limiter (FCL) devices. In this work, we refer on the results of electrical testing on resistive-type superconducting FCL prototypes made by Ni-sheathed MgB2, developed in the framework of the Italian Project LIMSAT. This is the first time ever that short circuit testing results are reported on MgB2-based FCL prototypes at 27 K, cooled by a liquid neon bath. The time evolution of limited current and voltage across SFCL prototypes are reported and analysed. Critical aspects associated to the fault event such as the steep HTS tape temperature rise and electrical insulation at cryogenic temperature are also discussed.