TANAKA, T., MURATA, N., SAITO, K., NISHIO, M., QIXIN GUO, & OGAWA, H. (2007, January 1). Study of Al thermal diffusion in Zn Te using secondary ion mass spectroscopy. 244(5). Berlin: Wiley, 2007. Retrieved from http://pascal-francis.inist.fr/vibad ndex.php?action=search&terms=18744660
ISO-690 (author-date, English)TANAKA, Tooru, MURATA, Norihiro, SAITO, Katsuhiko, NISHIO, Mitsuhiro, QIXIN GUO and OGAWA, Hiroshi, 2007. Study of Al thermal diffusion in Zn Te using secondary ion mass spectroscopy. In: [online]. Berlin: Wiley, 2007. 1 January 2007. Available from: http://pascal-francis.inist.fr/vibad ndex.php?action=search&terms=18744660
Modern Language Association 9th editionTANAKA, T., N. MURATA, K. SAITO, M. NISHIO, QIXIN GUO, and H. OGAWA. Study of Al thermal diffusion in Zn Te using secondary ion mass spectroscopy. no. 5, Berlin: Wiley, 2007., 2007, http://pascal-francis.inist.fr/vibad ndex.php?action=search&terms=18744660.
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TANAKA, T., MURATA, N., SAITO, K., NISHIO, M., QIXIN GUO and OGAWA, H. (2007), “Study of Al thermal diffusion in Zn Te using secondary ion mass spectroscopy”, in , Vol. 244, Berlin: Wiley, 2007., available at: http://pascal-francis.inist.fr/vibad ndex.php?action=search&terms=18744660.