YOON, Y.-J., CHOI, H., KIM, W.-C., SONG, T., & PARK, N.-C. (2007, January 1). Thickness tolerance compensation of SIL first surface near-field recording with replicated lens on SIL. 13(8-10). Berlin: Springer, 2007. Retrieved from http://pascal-francis.inist.fr/vibad ndex.php?action=search&terms=18756665
ISO-690 (author-date, English)YOON, Yong-Joong, CHOI, Hyun, KIM, Wan-Chin, SONG, Taesun and PARK, No-Cheol, 2007. Thickness tolerance compensation of SIL first surface near-field recording with replicated lens on SIL. In: [online]. Berlin: Springer, 2007. 1 January 2007. Available from: http://pascal-francis.inist.fr/vibad ndex.php?action=search&terms=18756665
Modern Language Association 9th editionYOON, Y.-J., H. CHOI, W.-C. KIM, T. SONG, and N.-C. PARK. Thickness tolerance compensation of SIL first surface near-field recording with replicated lens on SIL. no. 8-10, Berlin: Springer, 2007., 2007, http://pascal-francis.inist.fr/vibad ndex.php?action=search&terms=18756665.
Mohr Siebeck - Recht (Deutsch - Österreich)Emerald - Harvard
YOON, Y.-J., CHOI, H., KIM, W.-C., SONG, T. and PARK, N.-C. (2007), “Thickness tolerance compensation of SIL first surface near-field recording with replicated lens on SIL”, in , Vol. 13, Berlin: Springer, 2007., available at: http://pascal-francis.inist.fr/vibad ndex.php?action=search&terms=18756665.