GROZDANIC, D., RAKVIN, B., PIVAC, B., DUBCEK, P., RADIC, N., & BERNSTORFF, S. (2007, January 1). Structural characterization of thin amorphous Si films. 515(14). Lausanne: Elsevier Science, 2007. Retrieved from http://pascal-francis.inist.fr/vibad ndex.php?action=search&terms=18782672
ISO-690 (author-date, English)GROZDANIC, D, RAKVIN, B, PIVAC, B, DUBCEK, P, RADIC, N and BERNSTORFF, S, 2007. Structural characterization of thin amorphous Si films. In: [online]. Lausanne: Elsevier Science, 2007. 1 January 2007. Available from: http://pascal-francis.inist.fr/vibad ndex.php?action=search&terms=18782672
Modern Language Association 9th editionGROZDANIC, D., B. RAKVIN, B. PIVAC, P. DUBCEK, N. RADIC, and S. BERNSTORFF. Structural characterization of thin amorphous Si films. no. 14, Lausanne: Elsevier Science, 2007., 2007, http://pascal-francis.inist.fr/vibad ndex.php?action=search&terms=18782672.
Mohr Siebeck - Recht (Deutsch - Österreich)Emerald - Harvard
GROZDANIC, D., RAKVIN, B., PIVAC, B., DUBCEK, P., RADIC, N. and BERNSTORFF, S. (2007), “Structural characterization of thin amorphous Si films”, in , Vol. 515, Lausanne: Elsevier Science, 2007., available at: http://pascal-francis.inist.fr/vibad ndex.php?action=search&terms=18782672.