MAYANDI, J., FINSTAD, T. G., THOGERSEN, A., FOSS, S., SERINCAN, U., & TURAN, R. (2007, Januar 1). Scanning probe measurements on luminescent Si nanoclusters in Si O2 films. 515(16). Lausanne: Elsevier Science, 2007. Abgerufen von http://pascal-francis.inist.fr/vibad ndex.php?action=search&terms=18794112
ISO-690 (author-date, English)MAYANDI, J, FINSTAD, T. G, THOGERSEN, A, FOSS, S, SERINCAN, U und TURAN, R, 2007. Scanning probe measurements on luminescent Si nanoclusters in Si O2 films. In: [online]. Lausanne: Elsevier Science, 2007. 1 Januar 2007. Available from: http://pascal-francis.inist.fr/vibad ndex.php?action=search&terms=18794112
Modern Language Association 9th editionMAYANDI, J., T. G. FINSTAD, A. THOGERSEN, S. FOSS, U. SERINCAN, und R. TURAN. Scanning probe measurements on luminescent Si nanoclusters in Si O2 films. Nr. 16, Lausanne: Elsevier Science, 2007., 2007, http://pascal-francis.inist.fr/vibad ndex.php?action=search&terms=18794112.
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MAYANDI, J., FINSTAD, T.G., THOGERSEN, A., FOSS, S., SERINCAN, U. und TURAN, R. (2007), „Scanning probe measurements on luminescent Si nanoclusters in Si O2 films“, in , Bd. 515, Lausanne: Elsevier Science, 2007., verfügbar unter: http://pascal-francis.inist.fr/vibad ndex.php?action=search&terms=18794112.