MAYANDI, J., FINSTAD, T. G., THOGERSEN, A., FOSS, S., SERINCAN, U., & TURAN, R. (2007, January 1). Scanning probe measurements on luminescent Si nanoclusters in Si O2 films. 515(16). Lausanne: Elsevier Science, 2007. Retrieved from http://pascal-francis.inist.fr/vibad ndex.php?action=search&terms=18794112
ISO-690 (author-date, English)MAYANDI, J, FINSTAD, T. G, THOGERSEN, A, FOSS, S, SERINCAN, U and TURAN, R, 2007. Scanning probe measurements on luminescent Si nanoclusters in Si O2 films. In: [online]. Lausanne: Elsevier Science, 2007. 1 January 2007. Available from: http://pascal-francis.inist.fr/vibad ndex.php?action=search&terms=18794112
Modern Language Association 9th editionMAYANDI, J., T. G. FINSTAD, A. THOGERSEN, S. FOSS, U. SERINCAN, and R. TURAN. Scanning probe measurements on luminescent Si nanoclusters in Si O2 films. no. 16, Lausanne: Elsevier Science, 2007., 2007, http://pascal-francis.inist.fr/vibad ndex.php?action=search&terms=18794112.
Mohr Siebeck - Recht (Deutsch - Österreich)Emerald - Harvard
MAYANDI, J., FINSTAD, T.G., THOGERSEN, A., FOSS, S., SERINCAN, U. and TURAN, R. (2007), “Scanning probe measurements on luminescent Si nanoclusters in Si O2 films”, in , Vol. 515, Lausanne: Elsevier Science, 2007., available at: http://pascal-francis.inist.fr/vibad ndex.php?action=search&terms=18794112.