KOO, Y.-W., KIM, J.-H., CHO, W.-J., & CHUNG, H.-B. (2007, January 1). Investigation of resistance change characteristics with applied electric field on Ag/chalcogenide As2 S3 and As40 Ge10 Se15 S35 thin film structure. 84(5-8). Amsterdam: Elsevier Science, 2007. Retrieved from http://pascal-francis.inist.fr/vibad ndex.php?action=search&terms=18807516
ISO-690 (author-date, English)KOO, Yong-Woon, KIM, Jin-Hong, CHO, Won-Ju and CHUNG, Hong-Bay, 2007. Investigation of resistance change characteristics with applied electric field on Ag/chalcogenide As2 S3 and As40 Ge10 Se15 S35 thin film structure. In: [online]. Amsterdam: Elsevier Science, 2007. 1 January 2007. Available from: http://pascal-francis.inist.fr/vibad ndex.php?action=search&terms=18807516
Modern Language Association 9th editionKOO, Y.-W., J.-H. KIM, W.-J. CHO, and H.-B. CHUNG. Investigation of resistance change characteristics with applied electric field on Ag/chalcogenide As2 S3 and As40 Ge10 Se15 S35 thin film structure. no. 5-8, Amsterdam: Elsevier Science, 2007., 2007, http://pascal-francis.inist.fr/vibad ndex.php?action=search&terms=18807516.
Mohr Siebeck - Recht (Deutsch - Österreich)Emerald - Harvard
KOO, Y.-W., KIM, J.-H., CHO, W.-J. and CHUNG, H.-B. (2007), “Investigation of resistance change characteristics with applied electric field on Ag/chalcogenide As2 S3 and As40 Ge10 Se15 S35 thin film structure”, in , Vol. 84, Amsterdam: Elsevier Science, 2007., available at: http://pascal-francis.inist.fr/vibad ndex.php?action=search&terms=18807516.