BUNDAY, B. D., ALLGAIR, J. A., CALDWELL, M., SOLECKY, E. P., ARCHIE, C. N., RICE, B. J., SINGH, B., CAIN, J. P., & EMAMI, I. (2007, January 1). Value-added metrology. 20(3). New York, NY: Institute of Electrical and Electronics Engineers, 2007. Retrieved from http://pascal-francis.inist.fr/vibad ndex.php?action=search&terms=18990973
ISO-690 (author-date, English)BUNDAY, Benjamin D, ALLGAIR, John A, CALDWELL, Mark, SOLECKY, Eric P, ARCHIE, Charles N, RICE, Bryan J, SINGH, Bhanwar, CAIN, Jason P and EMAMI, Iraj, 2007. Value-added metrology. In: [online]. New York, NY: Institute of Electrical and Electronics Engineers, 2007. 1 January 2007. Available from: http://pascal-francis.inist.fr/vibad ndex.php?action=search&terms=18990973
Modern Language Association 9th editionBUNDAY, B. D., J. A. ALLGAIR, M. CALDWELL, E. P. SOLECKY, C. N. ARCHIE, B. J. RICE, B. SINGH, J. P. CAIN, and I. EMAMI. Value-added metrology. no. 3, New York, NY: Institute of Electrical and Electronics Engineers, 2007., 2007, http://pascal-francis.inist.fr/vibad ndex.php?action=search&terms=18990973.
Mohr Siebeck - Recht (Deutsch - Österreich)Emerald - Harvard
BUNDAY, B.D., ALLGAIR, J.A., CALDWELL, M., SOLECKY, E.P., ARCHIE, C.N., RICE, B.J., SINGH, B., CAIN, J.P. and EMAMI, I. (2007), “Value-added metrology”, in , Vol. 20, New York, NY: Institute of Electrical and Electronics Engineers, 2007., available at: http://pascal-francis.inist.fr/vibad ndex.php?action=search&terms=18990973.