ARAI, K., YAMASAKI, H., KAIHO, K., FURUSE, M., & NAKAGAWA, Y. (2007, Januar 1). Temperature characteristics of superconducting thin-film fault current limiting elements using high-resistivity alloy shunt layers. 17(2). New York, NY: Institute of Electrical and Electronics Engineers, 2007. Abgerufen von http://pascal-francis.inist.fr/vibad ndex.php?action=search&terms=19016622

ARAI, Kazuaki, YAMASAKI, Hirofumi, KAIHO, Katsuyuki, FURUSE, Mitsuho und NAKAGAWA, Yoshihiko, 2007. Temperature characteristics of superconducting thin-film fault current limiting elements using high-resistivity alloy shunt layers. In: [online]. New York, NY: Institute of Electrical and Electronics Engineers, 2007. 1 Januar 2007. Available from: http://pascal-francis.inist.fr/vibad ndex.php?action=search&terms=19016622

ARAI, K., H. YAMASAKI, K. KAIHO, M. FURUSE, und Y. NAKAGAWA. Temperature characteristics of superconducting thin-film fault current limiting elements using high-resistivity alloy shunt layers. Nr. 2, New York, NY: Institute of Electrical and Electronics Engineers, 2007., 2007, http://pascal-francis.inist.fr/vibad ndex.php?action=search&terms=19016622.

ARAI, K., YAMASAKI, H., KAIHO, K., FURUSE, M. und NAKAGAWA, Y. (2007), „Temperature characteristics of superconducting thin-film fault current limiting elements using high-resistivity alloy shunt layers“, in , Bd. 17, New York, NY: Institute of Electrical and Electronics Engineers, 2007., verfügbar unter: http://pascal-francis.inist.fr/vibad ndex.php?action=search&terms=19016622.